Focused Ion Beam Scanning Electron Microscopes
Closed Solicitation Posted
This opportunity was awarded. See the award notice from .
- Solicitation number
- NB100000-23-00586
- Agency
- National Institute of Standards and Technology Department of Commerce
- Responses due
- Set-aside
- No set-aside
Opportunity facts
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- PSC
- 6640 Laboratory Equipment And Supplies
- Place of performance
- Gaithersburg, Maryland 20899, United States
Notice details come from SAM.gov. Updated .
About this opportunity
The National Institute of Standards and Technology seeks to procure one gallium ion focused ion beam scanning electron microscope and one xenon plasma focused ion beam scanning electron microscope. Quotes are due no later than May 16, 2023 and must include firm fixed pricing for the microscope systems, optional accessories, installation and training, software licenses, and multi-year warranty and support periods. Proposals will be evaluated based on technical capability, past performance, and price. Award will be made to the responsible offeror providing the best value to the government.
There is no set-aside designation for this procurement. The primary NAICS code is 334516 and PSC code is Q200. Delivery and installation of the gallium ion microscope is required within 12 months of award, with the xenon plasma microscope to follow within 18 months. Performance will take place at the National Institute of Standards and Technology facilities in Gaithersburg, Maryland.
Notice text
3 versions
Update #3 · Latest ·
This is a combined synopsis/solicitation for commercial products or commercial services prepared in accordance with the format in subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. The solicitation is being issued using simplified acquisition procedures for certain commercial items under the authority of FAR 13.5.
The solicitation number is NB100000-23-00586 and this solicitation is a Request for Quotation (RFQ). This acquisition is being solicited as full and open.
The NIST Center for Nanoscale Science and Technology (CNST) has a requirement for one (1) Gallium ion (Ga+) source focused ion beam scanning electron microscope (Ga+ FIB) system and one (1) Xenon (Xe) plasma source focused ion beam scanning electron microscope (Xe PFIB) to support nanofabrication research and development.
SEE ATTACHED RFQ AND STATEMENT OF WORK FOR DETAIL AND QUOTE SUBMISSION INSTRUCTIONS.
*Amendment 0001 updates the Statement of Work (Attachment 1) and provides answers to questions received (Attachment 2).
*Amendment 0002 updates FAR 52.212-2 Evaluation Criteria.
Update #2 ·
This is a combined synopsis/solicitation for commercial products or commercial services prepared in accordance with the format in subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. The solicitation is being issued using simplified acquisition procedures for certain commercial items under the authority of FAR 13.5.
The solicitation number is NB100000-23-00586 and this solicitation is a Request for Quotation (RFQ). This acquisition is being solicited as full and open.
The NIST Center for Nanoscale Science and Technology (CNST) has a requirement for one (1) Gallium ion (Ga+) source focused ion beam scanning electron microscope (Ga+ FIB) system and one (1) Xenon (Xe) plasma source focused ion beam scanning electron microscope (Xe PFIB) to support nanofabrication research and development.
SEE ATTACHED RFQ AND STATEMENT OF WORK FOR DETAIL AND QUOTE SUBMISSION INSTRUCTIONS. *Amendment 0001 updates the Statement of Work (Attachment 1) and provides answers to questions received (Attachment 2).
Update #1 ·
This is a combined synopsis/solicitation for commercial products or commercial services prepared in accordance with the format in subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. The solicitation is being issued using simplified acquisition procedures for certain commercial items under the authority of FAR 13.5.
The solicitation number is NB100000-23-00586 and this solicitation is a Request for Quotation (RFQ). This acquisition is being solicited as full and open.
The NIST Center for Nanoscale Science and Technology (CNST) has a requirement for one (1) Gallium ion (Ga+) source focused ion beam scanning electron microscope (Ga+ FIB) system and one (1) Xenon (Xe) plasma source focused ion beam scanning electron microscope (Xe PFIB) to support nanofabrication research and development.
SEE ATTACHED RFQ AND STATEMENT OF WORK FOR DETAIL AND QUOTE SUBMISSION INSTRUCTIONS.
Attachments
| File | Type | Posted |
|---|---|---|
| NB100000-23-00586 RFQ Amendment 0002.pdf | ||
| NB100000-23-00586 RFQ Amendment 0001.pdf | ||
| Attachment 1 23-00586 SOW Amendment 0001.pdf | ||
| Attachment 2 QA.pdf | ||
| Attachment 1 23-00586 SOW 4-7-2023.pdf | ||
| NB100000-23-00586 RFQ.pdf |
Notice history
| Notice | Type | Posted |
|---|---|---|
| Focused Ion Beam Scanning Electron Microscopes | Award Notice | |
| Focused Ion Beam Scanning Electron Microscopes | Solicitation | |
| Focused Ion Beam Scanning Electron Microscope (FIB/SEM) System | Pre-Solicitation |
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