Attachment 2 QA.pdf
PDF 69 KB Posted
- Attached to
- Focused Ion Beam Scanning Electron Microscopes
- Solicitation number
- NB100000-23-00586
About this file
This document contains a request for quotation from the National Institute of Standards and Technology seeking proposals for a focused ion beam scanning electron microscope solution. NIST requires one gallium ion source focused ion beam scanning electron microscope and one xenon plasma source focused ion beam scanning electron microscope to support nanofabrication research and development. Offerors should submit a single quote for the entire microscope solution following the instructions in the attached request for quotation and statement of work, both of which provide additional detail on NIST's requirements. Proposals are due by April 29, 2023 as specified in the solicitation number NB100000-23-00586.
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Text version
NB100000-23-00586
Questions & Answers
April 24, 2023
Question 1: Is the requirement for this RFQ such that NIST is seeking one vendor for the entire solution?
Answer 1: NIST is seeking one vendor for the entire solution.
Question 2: Will offerors be considered if they only bid on one of the instruments?
Answer 2: All offers will be considered and reviewed for the entire solution.
File details come from the government source that posted it. Updated .