Focused Ion Beam Scanning Electron Microscopes
Awarded Award Notice Posted
- Solicitation number
- NB1000002300586
- Agency
- National Institute of Standards and Technology Department of Commerce
- Awarded
- to FEI Company
- Set-aside
- No set-aside
Opportunity facts
- Contract number
- 1333ND23PNB100359 Federal contract award
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- PSC
- 6640 Laboratory Equipment And Supplies
- Place of performance
- Gaithersburg, Maryland 20899, United States
Notice details come from SAM.gov. Updated .
About this opportunity
The Award Notice announced that FEI Company was awarded a contract by the Department of Commerce National Institute of Standards and Technology to provide Focused Ion Beam Scanning Electron Microscopes. The contract value is $738,390 for an unspecified quantity of microscopes. The notice shares details of the award as required by FAR 5.3, with FEI Company receiving the contract on September 12, 2023 for focused ion beam scanning electron microscopes.
Notice text
Synopses of Contract Award as required by FAR 5.3.
Description: Focused Ion Beam Scanning Electron Microscopes
Awarded contract 1333ND23PNB100359 to FEI COMPANY for 7383900.00 on 2023-09-12.
Notice history
| Notice | Type | Posted |
|---|---|---|
| Focused Ion Beam Scanning Electron Microscopes | Award Notice | |
| Focused Ion Beam Scanning Electron Microscopes | Solicitation | |
| Focused Ion Beam Scanning Electron Microscope (FIB/SEM) System | Pre-Solicitation |
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