Focused Ion Beam Scanning Electron Microscope (FIB/SEM) System

Closed Pre-Solicitation Posted

This opportunity was awarded. See the award notice from , or the latest solicitation from .

Solicitation number
NIST-SS23-CHIPS-0001
Agency
Responses due
Set-aside
No set-aside

Opportunity facts

Place of performance
Gaithersburg, Maryland 20899, United States

Notice details come from SAM.gov. Updated .

About this opportunity

Written by GovTribe AI ·

The National Institute of Standards and Technology seeks to procure a focused ion beam scanning electron microscope system to meet its requirements. As detailed in the attached sources sought notice NIST-SS23-CHIPS-0001, respondents are to provide information on their company and proposed equipment by October 31st. The microscope system must meet specified requirements for ion beam, electron beam, specimen chamber, detector, vacuum, and software characteristics. Responses will be evaluated based on the capability of the proposed system and services to meet NIST's performance needs.

There is no set-aside designated for this procurement. The anticipated NAICS code is 334516, and respondents are invited to suggest alternatives. No incumbent or current contractors are named. Pricing and other details are requested to facilitate NIST's market research, though no award values or budgets are stated. Manufacturing locations and available contracts or purchase agreements should also be included in responses to this pre-solicitation notice.

Notice text

THIS IS A SOURCES SOUGHT NOTICE

PLEASE SEE THE ATTACHMENT NIST-SS23-CHIPS-0001 FOR THE COMPLETE NOTICE DETAILS...

Files

File Type Posted
NIST-SS23-CHIPS-0001.docx DOCX document

Notice history

Notice Type Posted
Focused Ion Beam Scanning Electron Microscopes Award Award Notice
Focused Ion Beam Scanning Electron Microscopes Latest solicitation Solicitation
This notice Original Pre-Solicitation

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