Focused Ion Beam Scanning Electron Microscope (FIB/SEM) System

The National Institute of Standards and Technology seeks to procure a focused ion beam scanning electron microscope system to meet its requirements. As detailed in the attached sources sought notice NIST-SS23-CHIPS-0001, respondents are to provide information on their company and proposed equipment by October 31st. The microscope system must meet specified requirements for ion beam, electron beam, specimen chamber, detector, vacuum, and software characteristics. Responses will be evaluated based on the capability of the proposed system and services to meet NIST's performance needs.

There is no set-aside designated for this procurement. The anticipated NAICS code is 334516, and respondents are invited to suggest alternatives. No incumbent or current contractors are named. Pricing and other details are requested to facilitate NIST's market research, though no award values or budgets are stated. Manufacturing locations and available contracts or purchase agreements should also be included in responses to this pre-solicitation notice.