In Lens Field Emission Scanning Electron Microscope brand name or equal to JEOL

Closed Pre-Solicitation Posted

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Solicitation number
140G0225Q0088
Agency
Responses due
Set-aside
No set-aside

Opportunity facts

Notice details come from SAM.gov. Updated .

About this opportunity

The United States Geological Survey (USGS), Geology, Geophysics, and Geochemistry Science Center is conducting market research to identify potential suppliers for an In Lens Field Emission Scanning Electron Microscope, specifically seeking the JEOL USA JSM-IT800 (HL) model or equivalent. This sources sought notice aims to determine procurement methodology and assess market capacity for this analytical laboratory instrument classified under NAICS code 334516 with a size standard of 1,000 employees. Key technical requirements include 0.7nm resolution at 20kV, magnification capabilities from 10 to 2,000,000x, landing voltage range of 0.01 to 30kV, multiple imaging detectors including secondary and backscattered electron detectors, and compatibility with JEOL SXES detector systems. The government emphasizes compliance with the Buy American Act, prioritizing domestically manufactured products, and requires respondents to specify manufacturing origin and country of origin. Interested firms must submit their responses including product specifications, business size classification, and SAM.gov registration details by June 30, 2025 at 2:30 p.m. Mountain Daylight Time to Lisa Williams at ldwilliams@usgs.gov.

Currently, no set-aside designation has been determined, as the government will use the market research results to decide whether to proceed with a small business set-aside or full and open competition. No incumbent contractors or potential award values are specified in this pre-solicitation notice, as this is strictly a market research effort rather than a formal solicitation. The procurement involves a single unit of sophisticated electron microscopy equipment with specific technical specifications including a 3-year emitter warranty, eucentric goniometer stage with 5-axis motor drive, and air-cooled water chiller systems. Respondents must indicate their business classification as either small business entities (including Indian Small Business Economic Enterprise, 8(a), HUBZone, SDVOSB) or other than small business under the applicable NAICS code. The government has made clear that no contract award will result directly from this sources sought notice, and responses will not be returned or evaluated with feedback provided to submitting companies.

Notice text

In Lens Field Emission Scanning Electron Microscope brand name or equal to JEOL USA

THIS IS A SOURCES SOUGHT NOTICE ONLY FOR MARKET RESEARCH PURPOSES.

THIS IS NOT A REQUEST FOR PROPOSAL (RFP), REQUEST FOR QUOTATIONS (RFQ) OR INVITATION FOR BID (IFB).

NO FORMAL SOLICITATION IS BEING REQUESTED UNDER THIS NOTICE.

This Sources Sought Notice is for market research purposes to identify parties having an interest in and resources to support this requirement for a new In Lens Field Emission Scanning Electron Microscope brand name or equal to JEOL USA for the United States Geological Survey (USGS), Geology, Geophysics, and Geochemistry Science Center. The result of this market research will contribute to determining the method of procurement. The Government will review the information requested in this announcement based on the responses to this sources sought notice/market research, this requirement may be set-aside for small businesses or procured through full and open competition.

The North American Industry Classification System (NAICS) code is 334516 (Analytical Laboratory Instrument Manufacturing) and the size standard is 1,000 employees.

NOTE 1: The Buy American Act (41 U.S.C. 8301-05) is the primary federal procurement law providing a preference for domestic goods and manufactured products. As such, the USGS is seeking information on sources that can supply the described instrument either mined, produced or manufactured in the U.S. in sufficient and reasonably available commercial quantities of satisfactory quality.

A. Introduction

The United States Geological Survey (USGS), Geology, Geophysics, and Geochemistry Science Center has a requirement for a new In Lens Field Emission Scanning Electron Microscope brand name or equal to JEOL USA.

B. Brand Name or Equal Minimum Salient Characteristics:

JSM-IT800 (HL)
Resolution 0.7nm @20kV, 1.3 nm @ 1kV, 3.0 nm at 15 kV
Magnification Photo magnification: ×10 to ×2,000,000 (128 × 96 mm)
Display magnification: ×27 to ×5,480,000 (1,280 × 960 pixels)
Landing voltage 0.01 to 30 kV
Probe current and detector 5 pA to 300 nA (30 kV)
5 pA to 100 nA (5 kV)
In column probe current detector present
Absorbed current meter
Imaging Detectors Secondary electron detector (SED)
Upper electron detector (UED)
Low vacuum secondary electron detector
Retractable backscattered electron detector
Chamber camera
Other Detectors 60 mm SDD EDS Detector
System must be compatible with JEOL SXES detector
Electron gun In-lens Schottky Plus field emission electron gun
Emitter warranty period 3 years
Aperture angle control lens (ACL) Built-in
Objective lens Hybrid Lens
Specimen stage control Full eucentric goniometer stage, 5-axis motor drive
Stage movement range - X:70mm Y:50mm Z:1 to 41mm Tilt: -5 to 70 degrees, rotation: 360 degrees
Specimen size 170 mm diameter by 45 mm high
Cooling and Vacuum Air cooled water chiller, Retractable low vacuum system

(End of Brand Name or Equal Minimum Salient Characteristics)

If your organization has the potential ability to meet this requirement, please provide the following information to the Contracting Officer:

1. The firm shall specify the brand name product and manufacturer that meets the brand name or equal minimum salient characteristic listed above along with product specification sheet and product brochure.

2. For supply/equipment requirements, business responses shall include the place of manufacturing/country of origin (manufactured outside of US or manufactured in the US) per NOTE 1 above.

3. The firm shall specify that they are either:

3.1 An Indian Small Business Economic Enterprise (ISBEE), small business, 8(a), HUBZone, SDVOSB, etc. and Or

3.2 Other than small business under the NAICS Code listed in the announcement.

3.3 The firm shall provide a point of contact name and e-mail information, and SAM.gov (Unique Entity ID (UEI), and must be registered and active in System for Award Management (SAM).

All information submitted in response to this announcement is voluntary ¿ the Government will not pay for information requested nor will it compensate any respondent for any cost incurred in developing information provided to the Government. Materials submitted to the Government for review will not be returned. Respondents will not be notified of the results of the evaluation. This is NOT a Request for Proposal (RFP), Request for Quotations (RFQ) or Invitation for Bid (IFB). The Government does not intend to award a contract based on responses received under this announcement.

The government will evaluate market information to ascertain potential market capacity to provide services consistent in scope and scale with those described in this notice and otherwise anticipated.

In order to be responsive to this Notice, a firm shall provide the appropriate documentation for consideration by June 30, 2025 at 2:30 p.m. Mountain Daylight Time (MDT). Responses that do not comply with these procedures will not be considered.

Telephone inquiries will not be accepted or acknowledged, and no feedback or evaluations will be provided to companies regarding their submissions.

Inquiries will only be accepted by e-mail to Lisa Williams at ldwilliams@usgs.gov.

Files

File Type Posted
Sources_Sought_Notice-140G0225Q0088_1.pdf PDF

Notice history

Notice Type Posted
JEOL DEMO JSM-IT800(HL) In Lens Emission Scanning Electron Microscope Latest Limited / Sole Source Justification
In Lens Field Emission Scanning Electron Microscope brand name or equal to JEOL Latest special notice Special Notice
This notice Original Pre-Solicitation

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