JEOL DEMO JSM-IT800(HL) In Lens Emission Scanning Electron Microscope
Awarded Limited / Sole Source Justification Posted
- Solicitation number
- 140G0225Q0088
- Agency
-
Office of Acquisitions and Grants
US Geological Survey, Department of the Interior
- Set-aside
- No set-aside
Opportunity facts
- Contract number
- 140G0225P0137 Federal contract award
- Awardee
- Jeol Usa, Inc.
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- Points of contact
Notice details come from SAM.gov. Updated .
About this opportunity
The US Geological Survey's Geology, Geophysics, and Geochemistry Science Center issued a sole source justification for the acquisition of a JEOL demo unit JSM-IT800(HL) in-lens field emission gun scanning electron microscope (FESEM) under contract 140G0225P0137. The procurement enables the agency to resolve and measure features less than 3 nanometers in situ, supporting their scientific research capabilities. JEOL USA, Inc. was selected as the sole source vendor due to hardware compatibility requirements with existing JEOL detectors at the facility, ensuring data continuity across the agency's analytical operations. The contracting officer conducted market research through a sources sought notice posted on SAM.gov from June 23-30, 2025, which received only one response from JEOL USA, further validating the sole source determination. While the specific contract value has been redacted from the documentation, the procurement represents a one-time equipment acquisition with no planned future purchases of similar equipment. The justification emphasizes that JEOL USA is the only vendor capable of providing equipment that interfaces properly with the agency's existing detector systems, making competitive procurement impractical for this specialized scientific instrument.
Notice text
JEOL DEMO JSM-IT800(HL) In Lens Emission Scanning Electron Microscope Awarded contract 140G0225P0137 to unknown vendor for unknown amount on 2025-09-12.
Files
| File | Type | Posted |
|---|---|---|
| Sole_Source_Justification-Redacted_1.pdf |
Notice history
| Notice | Type | Posted |
|---|---|---|
| This notice | Limited / Sole Source Justification | |
| In Lens Field Emission Scanning Electron Microscope brand name or equal to JEOL | Special Notice | |
| In Lens Field Emission Scanning Electron Microscope brand name or equal to JEOL | Pre-Solicitation |
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