ATCH13_Base Support.pdf
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- Attached to
- Aerospace Materials Processing, Performance and Characterization (AMPPAC) Federal contract opportunity
- Solicitation number
- FA2394-24-R-B006
About this file
This document is an attachment detailing the base support equipment and facilities available for the Aerospace Materials Processing, Performance and Characterization (AMPPAC) solicitation, Solicitation Number FA2394-24-R-B006.
The attachment lists the office space, laboratory rooms, and various mechanical testing, materials characterization, scanning electron microscopy, focused ion beam, and transmission electron microscopy equipment that will be available for use at Wright-Patterson AFB, OH upon request. The equipment includes load frames, microscopes, polishing and preparation tools, and specialized imaging and characterization systems. It also specifies that maintenance agreements from original equipment manufacturers are required for certain equipment. The related federal contract opportunity is for research, assessment, development, testing, evaluation, prototyping, demonstration, and transition of technologies supporting the processing, behavior characterization, and performance prediction of advanced aerospace materials.
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Text version
FA2394-24-R-B006
Attachment 13
Base Support Equipment List & Available Base Facilities for Aerospace Materials Processing, Performance and Characterization (AMPPAC)
The following base support equipment and facilities at Wright-Patterson AFB, OH will be available upon request:
Office space includes desks, chairs, computers, and telephones for 14-18 individuals and laboratory space includes laboratory rooms.
Bldg. 655: Rooms: 057, 059, 062, 064, 067, 074, 083, 085, 092 - 099, and 136 Bldg. 654, Rooms: 04, 251, 253 and 225
Mechanical Testing Facility Description Quantity Two Post Servohydraulic Vertical Load Frame w/ 50kN Actuator 13 Two Post Servohydraulic Vertical Load Frame w/ 25kN Actuator 8 Two Post Servohydraulic Vertical Load Frame w/ 100kN Actuator 4 Two Post Electric Load Frame w/ 2kN Capacity 1 Two Post Servohydraulic Horizontal Load Frame w/ 100kN Actuator 1 Two Post Servohydraulic Vertical Tension-Torsion Load Frame w/ 100kN Actuator 1 Two Post Servohydraulic Vertical Load Frame w/ 220kN Actuator 1 Micro-tensile Stage 5 kN 1 Nikon Microscope w/ XY stage 1 Keyence VHX-5000 Optical Microscope 1 Keyence VR-5000 Optical Profilometer 1 Zeiss Axio Optical Microscope 1 Keyence VH-Z500R Optical Microscope 1 Micro-II Express Digital Acoustic Emission (AE) System 1 DIC – busted cart, 2D cart, Match ID, Correlated Solutions 1 Instron 68FM-300 electromechanical w/ 100 kN load cell 1 MTS Criterion Model 43 electromechanical w/ 50 kN load cell 2 MRF furnace 1 DIC Mobile Workstation 1 DIC 2D Mobile Workstation 1 DIC Match ID Mobile Workstation 1 DIC Correlated Solutions Mobile Workstation 1
Materials Characterization Facility
Description Quantity Metallography, Conventional Sample Preparation and Imaging
Allied PowerCut 10x 1 Allied TechCut 5 Saws 2 Allied TechCut 4 Saws 2 Allied VacuPrep 1
Buehler Polishers 11 Buehler Roll Grinders 3 Olympus Metallographs 2 Struers Electopolisher 5 1 Struers Mounting Presses 2 VCR Group Dimpler 2 Benchtop Optical Microscopes 5 Buehler High Speed Grinders 2 Buehler IsoMet 1000 Saws 4 Buehler Isomet 5000 1 Buehler Mounting Presses 3 Buehler Vibratory Polishers 7 Hardness testers (1 automated) 2 Keyence Optical Microscope System 1 Struers Exotom Saw 1 Zeiss Automated Metallograph 1 QATM Qness 60 Hardness Tester 1
Cryo-EM and Soft Material Preparation Cryo Transfer Holder 1 Leica GMP Plunge Freezing 1 Ultra Microtome 1 Pelco easiGlow 1
Laser Milling, Ion Polishing and Specialty Preparation Gatan Illion Ion Etching System 1 Fischione 1050 Ion Mill* 1 Fischione 1051 Ion Mill* 1 Fischione 1040 Nano Mill* 1 Fischione Electropolisher 1 Fischione 1070 Plasma Cleaner 1 Isotemp Vacuum Oven Model 281A 1 Leica TIC-3X Ion Beam Milling System 1 Quorum Sputter Coater 1 Emitech Sputter Coater 1 Denton Sputter Coater 1 MicroPrep Pro Laser Milling System 1 Gatan Dry Pumping Station 1 Gatan TURBO Pumping Station 1
Scanning Electron Microscopy and Focused Ion Beam Tescan Lyra FIB-SEMs* 2 FEI Quanta Environmental SEMs* 2 TFS Apreo C SEM* 1
Omniprobe Autoprobe* 1 Oxford EDS Detector* 3 Oxford EBSD Detector* 1
TFS HYDRA PFIB* - ETA FALL 2024 1
FEI Nova FIB-SEM* 1 Zeiss Gemini SEM* 1 Hitachi TM3000 SEM 1 EDAX EDS System* 1 EDAX EDS/OIM Systems* 2 EDAX EDS/OIM System 1 Nabity NPGS System 1
Transmission Electron Microscopy TFS Talos 200X TEM* 1 FEI Titan Field Emission Gun TEM* 1 Gatan Continuum-ER EELS System* 1 TFS Talos 200C TEM* 1 Gatan K2 Imaging Filter* 1 NanoMEGAS Precision Electron Diffraction System 1
X-ray Diffraction and Computed Tomography Zeiss 810 Ultra X-Ray Tomography System* 1
*Maintenance agreement from OEM required
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