Sole_Source_Justification-Redacted_1.pdf
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- Solicitation number
- 140G0225Q0088
About this file
This document is a Sole Source Justification for Acquisition under the Simplified Acquisition Threshold from the United States Geological Survey (USGS), Geology, Geophysics, and Geochemistry Science Center. The agency seeks to purchase a demo unit JEOL JSM-IT800(HL) in-lens field emission gun scanning electron microscope (FESEM) for $[redacted], which would enable resolving and measuring features less than 3 nm in situ. JEOL USA, Inc. is the sole source vendor due to hardware compatibility with existing JEOL detectors, and the Contracting Officer conducted market research by posting a sources sought notice on SAM.gov from June 23-30, 2025, receiving only one response from JEOL USA.
The procurement is a one-time requirement with no planned future acquisitions of similar equipment. The justification is based on the vendor being the only source that interfaces with existing detectors, ensuring data continuity. Price reasonableness will be determined using JEOL USA's current price list and paid invoices. The document includes certifications from the Program Office and Contracting Officer, with all employee signatures redacted as per USGS policy on Personal Protected Information.
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SOLE SOURCE JUSTIFICATION FOR ACQUISITION UNDER THE
SIMPLIFIED ACQUISITION THRESHOLD
PR: 0044020167
1. Contracting Agency and Activity. The Department of the Interior, United States Geological Survey, Geology, Geophysics, and Geochemistry Science Center.
2. Nature of Action Being Approved. Purchase of a demo unit JEOL JSM-IT800(HL) in-lens field emission gun scanning electron microscope (FESEM).
3. Description of Supplies or Services. The proposed demo unit JEOL JSM-IT800(HL) in lens field emission scanning electron microscope (FESEM) instrument would allow us to resolve and measure features less than 3 nm in situ. With current instrumentation, we are unable to resolve such fine features thus prohibiting determination of the residence of critical elements either as incorporated in the mineral structure or as nanosized inclusions in the mineral. This determination would have implications for the processes by which the critical elements are enriched in a given system.
4. Estimated Dollar Value. The maximum dollar amount is .
5. Statutory Authority. The proposed action may be awarded on a sole source basis under the authority of FAR 13.106-1(b)(1) – only one source reasonably available.
6. Rationale Supporting Use of Citation in No. 5. JEOL USA, Inc. is the only vendor that interfaces with existing JEOL detectors. For hardware compatibility and data continuity, we require a JEOL scanning electron microscope.
7. Other Information. N/A
8. The Efforts to Identify Additional Sources Including the Market Research Conducted.
Several vendors manufacture field emission gun scanning electron microscopes were evaluated. Review of vendor websites and conversations at trade shows with vendors indicates that only a JEOL IT800 series SEM or microprobe is compatible with JEOL detectors.
The Contracting Officer posted a sources sought notice 140G0225Q0085 via SAM.gov (Contract Opportunities) from June 23, 2025 through June 30, 2025 for market research purposes and received one response from JEOL USA.
9. Future Plans to Permit Competition.
This procurement is a one-time requirement and no planned acquisitions for additional in-lens SEMs are planned.
File details come from the government source that posted it. Updated .