Scanning Electron Microscope with EDS

The Federal Bureau of Investigation (FBI) Laboratory Division is soliciting quotes for a Scanning Electron Microscope (SEM) with Energy Dispersive X-Ray Analysis (EDS) capabilities through a Request for Quotation (RFQ) issued by the FBI Procurement Section. This procurement seeks to establish a firm-fixed price, one-time Purchase Order for specialized analytical laboratory equipment that will be delivered to the FBI's facility in Quantico, Virginia. The technical specifications require specific performance parameters including an XRF beam spot size of 25 microns or less, analytical working distances of 10mm and 15mm for both XRF and EDS functions, and a minimum take-off angle of 35 degrees at working distances of 10mm or greater. Questions regarding this solicitation must be submitted via email to Lily Calvert at lrcalvert@fbi.gov no later than July 7th, 2025, at 12:00 PM EST. The deadline for quote submissions is July 11th, 2025, providing vendors with a compressed timeline for response preparation.

This procurement does not utilize any set-aside designations, making it open to all qualified vendors in the marketplace. The solicitation does not identify any incumbent contractors or provide specific budget ranges for the anticipated award value. The equipment will be a single unit acquisition rather than multiple quantities, reflecting the specialized nature of the analytical instrument being procured. Performance will take place at the FBI's Quantico, Virginia facility, which serves as a key location for the Bureau's laboratory operations. The procurement falls under NAICS code 334516 for Analytical Laboratory Instrument Manufacturing and PSC code 6640 for Laboratory Equipment and Supplies, indicating the highly technical and specialized nature of the required microscopy equipment.