Questions and Answers.pdf
PDF 59 KB Posted
- Attached to
- Scanning Electron Microscope with EDS
- Solicitation number
- PR-002205
About this file
This document is a Questions and Answers (Q&A) file for a federal contract opportunity to acquire a Scanning Electron Microscope (SEM) with Energy Dispersive X-Ray Analysis (EDS) for the FBI Laboratory Division. The Q&A addresses three technical specifications: 1) the XRF beam spot size should be 25 microns or less at the vendor's optimal working distance, 2) both 10mm and 15mm analytical working distances are acceptable for XRF and EDS, and 3) the take-off angle should be measured at the vendor's preferred working distance, with a minimum of 35 degrees at a working distance of >=10mm. The document provides clarification on technical parameters to help potential vendors understand the precise requirements for the proposed equipment.
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Other files
| File | Type | Posted |
|---|---|---|
| RFQ_15F06725P002205_.pdf | ||
| ProductSpecifications .pdf |
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Questions and Answers:
1. Is 25 micron accurate, or is a smaller working distance acceptable?
The spot size for the XRF beam should be 25 micron (um) or less at the vendor's preferred/optimal working distance.
2. Is the 10mm or 15mm analytical working distance required?
Both 10mm or 15mm are acceptable for either XRF or EDS as they are both
~15mm.
The SEM/EDS and XRF/EDS do not need to be the same working distance but should be ~10mm to ~15mm. They can be the same working distance.
3. Minimum take off angle of 35 degrees at WD >=10mm – Is this for EDS, XRF or both?
The take-off angle should be measured at the vendor's optimal/preferred working distance.
File details come from the government source that posted it. Updated .