NASA Glenn Research Center Scanning Electron Microscope
Closed Pre-Solicitation Posted
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- Solicitation number
- 80TECH24Q0005
- Responses due
- Set-aside
- No set-aside
Opportunity facts
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- Place of performance
- Cleveland, Ohio 44135, United States
Notice details come from SAM.gov. Updated .
About this opportunity
NASA Glenn Research Center requires a high-resolution, thermal Schottky type field emission scanning electron microscope capable of both high and low vacuum modes of operation for organic and inorganic sample evaluation. The microscope must have an integrated ESD and particle analysis stage that can image samples up to 8kg without destruction and accommodate those up to 100mm in height and 200mm in diameter. It will be used for high resolution imaging of polymer, metal, and ceramic materials for fatigue and reaction evaluation under high temperature testing. Interested parties should submit a three page capability statement by December 1st, 2023 to the identified contracting officers.
There is no set-aside designated for this procurement. The primary NAICS code is 334516 and PSC code is J070. As the incumbent, key technical details include the microscope's ability to image samples weighing up to 8kg without damage at resolutions allowing analysis of high-cycle fatigue and reactions under testing up to 200mm in size and 100mm in height. Remote operation capability is also required.
Notice text
Nasa Glenn Research Center needs an analytical, high resolution, thermal Schottky type field emission scanning electron microscope (FE-SEM).
- Both high and low vacuum modes of operation for organic and inorganic sample evaluation, with integrated ESD (Energy-dispersive X-ray spectroscopy), particle analysis
- Stage large enough to image samples weighing up to 8kg without destruction of samples.
- Stage shall accommodate samples up to 100mm in height, and 200mm (or greater) in diameter without the need to remove any stage spacer or rotation module
- The FE-SEM will be used to evaluate polymer, metal and ceramic materials. An FE-SEM will allow for high resolution imaging of samples for high-cycle fatigue and reaction zones in high temperature testing and materials development.
- Must be capable of remote operation
Files
| File | Type | Posted |
|---|---|---|
| RFI - 80TECH24Q0005 - GSA -.pdf |
Notice history
| Notice | Type | Posted |
|---|---|---|
| High Resolution Field Emission Scanning Electron Microscope | Solicitation | |
| Notice of Intent to Sole Source- 80TECH24Q0005 | Special Notice | |
| This notice | Pre-Solicitation |
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