RFI - 80TECH24Q0005 - GSA -.pdf

Rev.: 07/2021

NATIONAL AEORNAUTICS AND SPACE ADMINISTRATION (NASA)

INFORMATION TECHNOLOGY PROCUREMENT OFFICE (ITPO)

RFI 80TECH24Q0005

NASA/Glenn Research Center (GRC) is hereby soliciting information from potential sources for analytical, high resolution, thermal Schottky type field emission scanning electron microscope (FE-SEM).

The National Aeronautics and Space Administration (NASA) Glenn Research Center is seeking capability statements from all interested parties, including all socioeconomic categories of Small Businesses and Historically Black Colleges and Universities (HBCU)/Minority Institutions (MI), and members of the underserved communities as defined by Executive Order 13985, Advancing Racial Equity And Support For Underserved Communities Through The Federal Government, for the purposes of determining the appropriate level of competition and/or small business subcontracting goals for High Resolutioon Fiend Emission Scanning Electron Microscope. The Government reserves the right to consider a Small, 8(a), Women-owned (WOSB), Service Disabled Veteran (SD-VOSB), Economically Disadvantaged Women-owned Small Business (EDWOSB) or HUBZone business set-aside based on responses received.

No solicitation exists; therefore, do not request a copy of the solicitation. If a solicitation is released, it will be synopsized on SAM.gov, GSA e-Buy, or NASA SEWP. Interested firms are responsible for monitoring these websites for the release of any solicitation or synopsis.

Interested firms having the required capabilities necessary to meet the above requirement described herein should submit a capability statement of no more than 3 pages indicating the ability to perform all aspects of the effort.

The requirement is considered to be a commercial or commercial-type product. A commercial item is defined in FAR 2.101.

All responses shall be submitted electronically via email to Kavina Patel, Contract Specialist (kavin.patel@nasa.gov ) and Wayne Plummer, Contracting Officer (wayne.s.plummer@nasa.gov )no later than Friday, December 1, 2023 by 5PM EST . Please reference 80TECH24Q00005 in any response.

This synopsis is for information and planning purposes only and is not to be construed as a commitment by the Government nor will the Government pay for information solicited. Respondents will not be notified of the results of the evaluation. Respondents deemed fully qualified will be considered in any resultant solicitation for the requirement.

Rev.: 07/2021

a. RFI/Draft Solicitation or SOW

THIS IS NOT A REQUEST FOR PROPOSAL. NO PROPOSALS ARE TO BE

SUBMITTED IN RESPONSE TO THIS NOTICE.

This notice is issued by the NASA/Information Technology Procurement Office (ITPO) to post a Statement of Work (SOW) to solicit responses from interested parties. This document is for information and planning purposes and to allow industry the opportunity to verify reasonableness and feasibility of the requirement, as well as promote competition.

This presolicitation synopsis is not to be construed as a commitment by the Government, nor will the Government pay for the information submitted in response. The Government may not respond to questions/concerns submitted. The Government will use the information to finalize the RFQ as necessary.

All comments or questions shall be submitted electronically via email to Kavina Patel, Contract Specialist (kavin.patel@nasa.gov ) and Wayne Plummer, Contracting Officer (wayne.s.plummer@nasa.gov ) no later than Thursday, November 30, 2023 by 2PM EST. When responding reference 80TECH24Q0005.

NASA Clause 1852.215-84, Ombudsman, is applicable. The Center Ombudsman for this acquisition can be found at :

https://www.hq.nasa.gov/office/procurement/regs/Procurement-Ombuds-Comp- Advocate-Listing.pdf

If a solicitation is released, then it and any additional documents will be available on www.Sam.gov, GSA eBuy, or NASA SEWP. It is the offeror's responsibility to monitor this website for the release of the solicitation and amendments (if any).

Potential offerors will be responsible for downloading their own copy of the solicitation and amendments, if any.

STATEMENT OF WORK

High Resolution Field Emission Scanning Electron Microscope

1. Objective/Requirements

Nasa Glenn Research Center needs an analytical, high resolution, thermal Schottky type field emission scanning electron microscope (FE-SEM).

- Both high and low vacuum modes of operation for organic and inorganic sample evaluation, with integrated ESD (Energy-dispersive X-ray spectroscopy), particle analysis

- Stage large enough to image samples weighing up to 8kg without destruction of samples.

o Stage shall accommodate samples up to 100mm in height, and 200mm (or greater) in diameter without the need to remove any stage spacer or rotation module

- The FE-SEM will be used to evaluate polymer, metal and ceramic materials. An FE-SEM will allow for high resolution imaging of samples for high-cycle fatigue and reaction zones in high temperature testing and materials development.

- Must be capable of remote operation

2. Characteristics, Scope, and Specifications

A. Chamber and Stage Requirements

- Large mechanically eucentric sample stage o Stage size 200mm, with 8kg weight capability in XYZRT 6kg weight capability in XYZR.

o Travel: X: 125mm, Y: 100mm, Z: 80mm, R: 360o, Tilt = -10o to 90o o Movement options to include both keyboard/mouse control and joystick

- Chamber large enough to image samples weighing up to 8kg without destruction of samples.

o Stage shall accommodate samples up to 100mm in height, and 200mm (or greater) in diameter without the need to remove any stage spacer or rotation module and provide all 5 axis movement o Must be capable of mounting of samples up to 160mm in height (with smaller diameters) via alternative mounting methods to the stage – i.e. side mount options

- Sample Navigation System – high resolution color cameras internal to chamber for sample navigation. Color image must link to SEM images for map of analysis locations with store and recall of position and analysis conditions.

o In-Chamber IR Cameras – On-axis and Off-axis for sample, stage, chamber and detector observation and navigation – linked to stage, for navigation from the optical image o Integrated ex-situ camera allowing for image capture of specimens up to 200mm in diameter

- Additional Ports on chamber for capability to add additional detectors in the future

- High Speed Pumping System – Less than 5 minute Sample Exchange Time

B. Detector Requirements

- Must include the following Detectors:

1. Everhart-Thornley type Secondary Electron Detector

2. Multi-Element High Sensitivity Backscatter Electron (BSE) Detector

Acquires simultaneous Back-Scatter Electron and Secondary Electron Images.

• Accelerating voltage 0.5kV – 30kV

• Both high and low-vacuum modes for imaging multiple types of samples.

Microanalysis real-time while imaging in BSE and SE modes Integrated EDS and EBSD system, with simultaneous EDS/EBSD collection

• High count rate EDS – minimum 125,000cps for C, F, and Mn K-alpha energy lines

• EBSD detector with greater than 5500 patterns per second, with fiber optic lensing

• Detector tilt control

• Software control for EBSD/EDS system

Qualitative (ZAF) and Quantitative (PRZ) Analysis

• Area, Point, and Line Data Collection and Analysis

• User Generated Database Capability

Automated large area mapping – montage functionality

• Drift Correction

• Live acquisition Mapping

Peltier Cooled Dry Silicon Drift Detector; thin film window

• Detects elements Be to U

• Energy resolution <130eV for Mn-Kα FWHM

C. Electron Gun Requirements

- In-lens Thermal Schottky type Field Emission electron gun

- Field Emission electron gun positioned in the field of the first condenser lens to maximize the current (+300nA) generated into the probe.

- Electronic Aperture Control to optimize convergence angle

- Gun Isolation chamber/valve system

- Field Emission emitter shall be guaranteed for a minimum of 3 years

D. Imaging Requirements

- Built in Montage Imaging, Vibration Dampening, Drift Correction functions

- Magnification range from 5X to 600,000X print,14X to 1,679,449 display

- Resolution Requirements:

o 1nm resolution (or better) at 30kV, in high vacuum mode o 3nm resolution (or better) at 1kV, in high vacuum mode o Resolution under standard analytical conditions to be 3nm at 15kV o 1.8nm resolution (or better) at 15kV, in low vacuum mode

- Simultaneous SE/BSE Imaging, including signal mixing functions o Live image dual view capable

- Ability to capture live video images (AVI format or equivalent)

- On-screen measurement and annotation

- Image database management

- Automatic Focus, Astigmatism Correction, and Brightness/Contrast

- On screen Brightness/Contrast, Gama, and Filtering options

- Variable Scan Modes to reduce sample charging

- Ability to recall imaging conditions from stored SEM images

E. Hardware and Software Requirements

- Dell Optiplex 5080 (or 7080) Tower PC, or alternate computer tower on NASA’s Assessed and

Cleared List o Windows 10 Operating System

Microsoft Office, Home and Business SEM Control Software o DVD / RW Optical Disk Drive

F. Warranty and Installation Requirements

- Minimum 1 year parts and service warranty with purchase of FE-SEM included in pricing

- Installation and Proof of Performance included

- User Training – on-site or remote

- Operation Manuals

Optional Extended Warranty Options for 1, 2, and 3 years at time of purchase 24-hour support response

- Basic Operation and Continuous Application Support for the life of the equipment

- Low Power and Facilities Requirements

- Single Phase Electrical Installation (AC117V, 60Hz)

- Dry Compressed Air

- No water required - i.e., no water chiller needed for operation of microscope

- Compact Footprint: Microscope Column Not to Exceed 38” W x 40” D x 70” H

3. Place of Performance

Equipment to be installed at NASA Glenn Research Center, 21000 Brookpark Rd, Cleveland, OH 44135

4. Period of Performance Delivery of equipment is expected within 5 months ARO. A service installation visit will be scheduled upon arrival of the equipment.