Microscope Components
Closed Solicitation Posted
This opportunity was awarded. See the award notice from .
- Solicitation number
- 1333ND24QNB030371
- Agency
- National Institute of Standards and Technology Department of Commerce
- Responses due
- Set-aside
- No set-aside
Opportunity facts
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- PSC
- 6640 Laboratory Equipment And Supplies
- Place of performance
- Boulder, Colorado 80305, United States
- Points of contact
-
- Tracy Retterer tracy.retterer@nist.gov (301) 575-8448
- Joni L. Laster joni.laster@nist.gov (301) 975-6205
Notice details come from SAM.gov. Updated .
About this opportunity
The National Institute of Standards and Technology (NIST) Radio Frequency (RF) technology division is seeking to procure inspection microscope components, including 4K cameras, objective lenses of various magnifications, and manual Z focus blocks, to build custom manual probe stations for characterizing active devices and circuits above 100 GHz. This procurement is intended to support the development and verification of high-frequency transistor models under the CHIPS program. NIST is seeking a technically acceptable solution at the lowest price, with quotations due by July 12, 2024 at 12pm EST. The solution must meet specific requirements such as 4K resolution, long working distance objective lenses, and manual Z focus blocks with fine adjustment and high load capacity.
This is an unrestricted solicitation, with no set-aside designations. The required items and quantities are listed in the Combined Synopsis/Solicitation document, with a North American Industrial Classification System (NAICS) code of 334516 - Analytical Laboratory Equipment Manufacturing and a Product Service Code (PSC) of 6640 - Laboratory Equipment And Supplies. The place of performance is Boulder, CO 80305, USA, and delivery is required within 11 weeks of order placement, with a 1-year warranty on the equipment.
Notice text
Advanced semiconductor technology has led to continuous performance improvements in transistors. However, many iterations are needed to obtain optimal performance and the yield and reproducibility is incredibly poor. Furthermore, US chip makers are ill-equipped with legacy measurement techniques and underperforming models. We propose a robust path to develop and verify high-frequency transistor models: 1) new on-wafer standards and calibration, 2) precision noise measurements for transistor quality assurance, 3) improved characterizations, 4) optimal models tailored to a given technology, and 5) transistor model verification across frequency with key performance indicators.
The National Institute of Standards and Technology (NIST) Radio Frequency (RF) technology division is seeking inspection microscope components to build custom manual probe stations dedicated to the characterization of active devices and circuits above 100 GHz. The solution must include 4k cameras, objective lenses of several magnifications, and manual Z focus blocks. This solution will enable transistor large-signal characterization that will be used to extract and validate transistor models under the CHIPS program.
See attachment for complete notice details
Attachments
| File | Type | Posted |
|---|---|---|
| Requirements.docx | DOCX document | |
| 1333ND24QNB030371.docx | DOCX document |
Notice history
| Notice | Type | Posted |
|---|---|---|
| Microscope Components | Award Notice | |
| Microscope Components | Solicitation |
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