LT-SPM
Closed Pre-Solicitation Posted
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- Solicitation number
- BSA475591
- Agency
-
Office of Science
Department of Energy
- Responses due
- Set-aside
- No set-aside
Opportunity facts
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- PSC
- 6640 Laboratory Equipment And Supplies
- Place of performance
- New York 11973, United States
- Points of contact
Notice details come from SAM.gov. Updated .
About this opportunity
The Department of Energy Office of Science anticipates soliciting the construction and integration of a low-temperature scanning probe microscope (LT-SPM) into an existing multiprobe ultrahigh-vacuum surface analysis system, with responses due by June 19, 2026.
The LT-SPM will comprise a new SPM scanner, sample stage with seven additional electrical contacts, removable magnetic field assembly, internal electronics, wiring, and cabling, integrated with an existing cryostat previously procured from the same supplier for a prior low-temperature STM system. All SPM cabling must be compatible with the existing Scienta Omicron MATRIX SPM controller. The supplier will design and build a new UHV SPM chamber in close collaboration with Brookhaven National Laboratory's Center for Functional Nanomaterials (CFN) staff to ensure full compatibility with the existing multiprobe system, enabling sample and STM tip transfer between chambers and reliable SPM operation under UHV conditions. The supplier will install all new components within the cryostat at CFN, including internal electronics, wiring, and cabling, then perform system performance and quality tests on an Au(111) crystal or graphite surface to demonstrate atomic resolution for both STM and AFM modes. Performance takes place at CFN. No set-aside applies. The procurement falls under NAICS 334516 (Analytical Laboratory Instrument Manufacturing) and PSC 6640 (Laboratory Equipment and Supplies).
Notice text
BSA is procuring the Construction and Integration of a Low-Temperature SPM into a Multiprobe UHV Surface Analysis System. The requirement form and/or function supports the design and construction of a low-temperature scanning probe microscope (LT-SPM) and its integration into the existing multiprobe system without compromising or sacrificing any original system functionality. The LT-SPM will include a new SPM scanner, a sample stage with seven additional electrical contacts, a removable magnetic field assembly, required internal electronics, and all necessary wiring and cabling, while utilizing an existing cryostat previously purchased from the same Supplier for a prior LT-STM system. All SPM cabling will be compatible with the existing Scienta Omicron MATRIX SPM controller. In addition, A UHV SPM chamber will be designed and built by the Supplier in close collaboration with CFN staff to ensure full compatibility with the existing multiprobe system, enabling smooth sample and STM tip transfer between chambers and reliable SPM operation under UHV conditions. The Supplier will install all new components within the cryostat at CFN, including internal electronics, wiring, and cabling, and will perform system performance and quality tests on an Au(111) crystal or graphite surface to demonstrate atomic resolution for both STM and AFM.
Notice history
| Notice | Type | Posted |
|---|---|---|
| LT-SPM | Solicitation | |
| Low-Temperature (LT) Scanning Probe Microscope (SPM) | Solicitation | |
| This notice | Pre-Solicitation |
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