Cryo-Electron Microscopy Instruments
Closed Solicitation Posted
- Solicitation number
- BZ-2025-04
- Agency
-
Department of Energy
- Responses due
- Set-aside
- No set-aside
Opportunity facts
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- Place of performance
- Berkeley, California 94720, United States
- Points of contact
Notice details come from SAM.gov. Updated .
About this opportunity
Lawrence Berkeley National Laboratory (LBNL) is seeking proposals for Cryo-Electron Microscopy Instruments for the Molecular Foundry, specifically requesting Focused Ion Beam and Scanning Transmission Electron Microscope instruments capable of operating under cryogenic conditions. The Department of Energy, as the sponsoring agency, is soliciting proposals with three primary capabilities: high-resolution TEM imaging for biological specimen analysis, high-resolution STEM imaging for materials science applications, and dual beam FIB for TEM sample preparation. The procurement will be awarded based on best overall value, considering price, performance features, and supplier attributes, with the NAICS code 334516 for Analytical Laboratory Instrument Manufacturing. Potential vendors must submit proposals by January 23, 2025, at 3:00 PM Pacific Time, with questions due by January 16, 2025. Offerors may propose any number of instruments that can satisfy the specified requirements, with the understanding that fewer than three instruments might be acceptable if they meet multiple capability needs.
The solicitation is not set aside for any specific business category, meaning it is open to all qualified vendors. While specific award values are not explicitly stated, the procurement is expected to span fiscal years 2025-2026 with a milestone payment schedule and no advance deposits permitted. The instruments are expected to maintain reliable operations over a 10-year lifespan and must include appropriate documentation, acceptance testing, and NRTL certification. The place of performance is Berkeley, CA 94720, specifically at the Molecular Foundry facility. The final number and configuration of instruments will depend on performance specifications, proposed prices, and available funding. Vendors must provide firm fixed prices in US dollars, including itemized costs for instruments and options, with freight costs to be delivered to Berkeley.
Notice text
Lawrence Berkeley National Laboratory requests a proposal for Focused Ion Beam and Scanning Transmission Electron Microscope instruments usable at cryogenic conditions for the Molecular Foundry. The final number, combination, and configuration of instruments (including options) that will be acquired is dependent on performance specifications and prices proposed, along with available funding. The capabilities required from these instruments are as follows, listed in order of importance:
- High resolution TEM imaging used for single particle analysis and cryo-tomography for biological specimens under cryogenic conditions.
- High resolution STEM imaging for ptychography and 4D-STEM under cryogenic conditions for materials science applications.
- Dual beam FIB to be used for TEM sample preparation and cryogenic transfer to a TEM.
It is possible that combinations of these capabilities could be satisfied with fewer than three instruments. Offerors may propose any number of instruments that would satisfy these requirements. Please see the RFP document for full details.
Files
| File | Type | Posted |
|---|---|---|
| Insurance Cert Instructions.pdf | ||
| Sample Subcontract.docx | DOCX document | |
| RFP BZ-2025-04.pdf | ||
| Representations Certifications.docx | DOCX document | |
| General Provisions.pdf |
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