TECH_SPECS_TESEC_Voltage_REG.pdf

Rev 06/26/2024

Technical Specifications

TESEC Voltage Regulator Test Option

DLA Product Test Center, VTA

I. The contractor shall provide all labor, materials, tools, transportation, supplies, supervision, etc. (except as noted), necessary to provide all components for a TESEC Voltage Regulator Test Option used to perform automated testing of voltage regulators using our existing TESEC Model 881-TT Semiconductor Test System to the Defense Supply Center Columbus (DSCC), Columbus, Ohio. The salient characteristics of the TESEC

Voltage Regulator Test Option are as listed below:

A. TESEC Voltage Regulator Test Option with the following salient characteristics:

1. Shall be new, not refurbished.

2. Shall be supplied with Operating manual.

3. Shall function with our existing TESEC Model 881-TT Semiconductor Test System.

4. Shall be able to test output voltage with the following capabilities:

a. Measurement range of VOUT 000.0 mV to 20.00 V.

b. Force ranges for VIN 1 – 80 V and IOUT 100 nA to 20.0 A.

c. Accuracy:

i. 0.5% +1 mV when resolution is 1 mV

ii. 0.5% + 10 mV when resolution is 10 mV

iii. 0.5% + 1 nA when resolution is 1 nA

5. Shall be able to test quiescent current with the following capabilities:

a. Measurement range of IQ 000.0 nA to 20.00 A

b. Forcing Range VIN 1.00 to 80.0 V and IOUT 100 nA to 20.0 A

c. Accuracy:

i. 0.5% + 10 nA when resolution is 10 nA

ii. 0.5% + 10 mV when resolution is 10 mV

iii. 0.5 + 1 nA when resolution is 1 nA

6. Shall be able to test breakdown current with the following capabilities:

a. Measurement range of IBD 000.0 nA to 20.00 A

b. Forcing Range VIN: 1.00 to 80.0 V

c. Accuracy:

i. 0.5% + 10 nA when resolution is 10 nA

ii. 0.5% + 10 mV when resolution is 10 mV

7. Shall be able to test input isolation current with the following capabilities:

a. Measurement range of INPUTI 000.0 nA to 9.999 A

b. Forcing Range VIN 100 mV to 40.0 V

c. Accuracy:

i. 0.4% + 1 nA when resolution is 1 nA

ii. 0.5% + 1 mV when resolution is 1 mV

8. Shall be able to test short circuit current limit with the following capabilities:

a. Measurement range of ISC 000.0 nA to 9.999 A

b. Forcing Range VIN: 100 mV to 40.0 V

c. Accuracy:

i. 0.4% + 1nA when resolution is 1 nA

ii. 0.5% + 1 mV when resolution is 1 mV

9. Shall be able to test bias current with the following capabilities:

a. Measurement range of IQIN 000.0 nA to 9.999 A

DLA Product Test Center, VTA

b. Forcing Ranges for VIN: 100 mV to 40.0 V and IOUT 100 nA to 20.0 A

c. Accuracy:

i. 0.4% + 1 nA when resolution is 1 nA

ii. 0.5% + 1 mV when resolution is 1 mV

iii. 0.5% + 1 nA when resolution is 1 nA

10. Shall be able to test peak output current with the following capabilities:

a. Measurement range of IPEAK 000.0 nA to 9.999 A

b. Forcing Ranges for VIN 100 mV to 80.0 V and VOUT 100 mV to 40.0 V

c. Accuracy:

i. 0.4% + 1 nA when resolution is 1 nA

ii. 0.5% + + mV when resolution is 1 mV

iii. 0.5% + 1 nA when resolution is 1 mV

11. Shall be able to test reference voltage with the following capabilities:

a. Measurement range of VREF 000.0 mV to 20.00 V

b. Forcing Ranges for VIVO 1.00 to 80.0 V and IOUT 100 nA to 20.0 A

c. Accuracy:

i. 0.5% + 1 mV when resolution 1 mV

ii. 0.5% + 10 mV when resolution 10 mV

iii. 0.5% + 1 nA when resolution 1 nA

12. Shall be able to test output voltage with the following capabilities:

a. Measurement range of VOUTA 000.0 mV to 20.00 V

b. Forcing Ranges for VIVO 1.00 to 80.0 V and IOUT 100 nA to 20.0 A

c. Accuracy:

i. 0.5% + 1 mV when resolution 1 mV

ii. 0.5% + 10 mV when resolution is 10 mV

iii. 0.5% + 1 nA when resolution is 1 nA

13. Shall be able to test output voltage with the following capabilities:

a. Measurement range of IOMAX 000.0 nA to 20.0 A

b. Forcing Ranges for VIVO 1.00 mV to 20.0 V and *IMAX 1.00 to 9.99mA, 10.0 to 99.9 mA and 100 to 999 mA

c. Accuracy:

i. 0.5% + 1 nA when resolution 1 nA

ii. 0.5% + 10 mV when resolution 10 mV

iii. 0.5% when resolution is –

14. Shall be able to test adjustment pin current with the following capabilities:

a. Measurement range: IADJ: 000.0 nA to 999.9 uA

b. Forcing ranges for VIVO 1.00 to 80.0 V and IOUT 100 nA to 20.0 A

c. Accuracy:

i. 0.5% + 1nA when resolution 1 nA

ii. 0.5% + 10 mV when resolution 10 mV

iii. 0.5% + 1 nA when resolution 1 nA

B. Required Upgrades and Accessories - Brand Name or Equal:

1. Shall at a minimum have: Included Accessories: All necessary electrical cables, communication cables to install and operate machine.

DLA Product Test Center, VTA

2. Shall perform the required Software and firmware updates C. Other Requirements:

1. Delivery: 10 Weeks from date of the award.

2. Contractor shall perform onsite installation and training for up to 4 associates.

3. Contractor shall give notification to Jeremiah L. Jones (jeremiah.l.jones@dla.mil /614-692-8955) when the instrument is ready to be delivered.

4. All shipping costs are to be included in the contracted price.

5. The instrument shall be delivered to:

Defense Supply Center Columbus

300 North James Road, Bldg 17-3

Mark for: DLA Product Test Center, Bldg 11-7 (TE Lab)

Attn: Jeremiah L. Jones (jeremiah.l.jones@dla.mil / 614-692-8955)

Columbus, Ohio 43213

6. Invoices shall be submitted through Wide Area Workflow (WAWF), See DFARS Clause 252.232-

7006 Wide Area Workflow Payment Instructions for detailed instructions on how to submit invoices.

mailto:jeremiah.l.jones@dla.mil mailto:jeremiah.l.jones@dla.mil