S-44000-00005242_Att C_Specifications~2.pdf

ITB #S-44000-00005242 – X-Ray Diffraction System Att C

Attachment C Specifications

Agency is requesting Bids for the purchase and delivery of one (1) new RIGAKU SmartLab PhotonMax Multipurpose Ѳ/Ѳ1 X-ray Diffraction System. Agency will not accept bids for equipment other than the requested equipment.

Bid Equipment MUST meet or exceed all the following specifications and include all of the following:

Item

Qty Part

Number Description

1 1 A00009094 PhotonMax 9kW High Brilliance X-ray Source

• PhotonMax EXRT Anode, Cu Target – 3 times longer life time than previous generations

• 9kW Continuous Rated Maximum Output Power

• 20 to 45 kV, 1 kV steps, 3Φ

• 10 to 200 mA, 1 mA steps

• Stability: ± 0.005 % for 10 % input power variation

• Computer-control and manual operation.

• Electromagnetic shutter and single shutter control

• Take-off angle: 6° forward (beam parallel to table top)

• High-voltage cable

• Cathode Assembly, 0.4 x 8mm Line Focus

• Filament Assembly, 0.4 x 8mm Line (set of 3)

Safety Features

• X-ray “ON” warning light

• Abnormal cooling water flow, pressure and vacuum level detection

• Abnormal generator overload and tube voltage detection.

• Emergency stop switch.

• Leak current breaker.

• X-rays completely shut off if any of the fail-safe devices are tripped, or fail to operate.

1 Ѳ/Ѳ stands for zeta-zeta

2 1 Included with A00009094

Radiation Enclosure

• Steel construction with integrated lead panel direct beam stop.

• Safety interlocked with electromagnetic shutter mechanism.

Sliding front access doors with high/low leaded-acrylic windows.

• Lighted interior.

• Dimensions: 1300mm x 850mm x 1720mm (W X D X H)

3 1 Included with A00009094

Goniometer System SmartLab High-Resolution Vertical Ɵ/Ɵ Goniometer

• High-precision, vertical Ɵ/Ɵ geometry (horizontal sample)

• Optical encoder controlled

• Fully automated alignment

• Independently controlled Ɵs (source) and Ɵd (detector) axes

• Measuring range: -10 – 160° (2Ɵ)

• Scanning speed: 0.01°/min - 20°/min (Ɵs, Ɵd)

• Slewing speed: max. 250°/min (Ɵs, Ɵd)

• Step Resolution: 0.0001°(Ɵs, Ɵd)

• Scanning Method: Ɵs / Ɵd independent or coupled

• Accessories Kit including:

Standard Sample Holder Attachment

* Stage for the powder and bulk sample holders.

* Includes electronics for the attachment-type sensor

Center Slit for alignment

Si Reference Standard Hex screwdriver for optics units mounting

4 1 with A00009094

Sample Stages High Precision Z-Stage for Horizontal Sample Measurement

• High-precision motor driven sample stage

• Z: -10 ~ 1 mm / 0.0005 mm step

Includes Powder Sample Holders:

• (2100/AL) Qty 2 – Aluminum, Sq., 20 x 20 mm

• (9200/2G) Qty 2 – Glass, Sq., 0.2mm indent, 20 x 20 mm

• (9200/5G) Qty 5 – Glass, Sq., 0.5mm indent, 20 x 20 mm

5 1 with A00009094

Diffracted Beam Optics Diffracted Beam Optics Assembly

• Receiving Slit 1: Computer-Controlled, 0.05 mm - 20 mm, 0.01 mm step

• Receiving Slit 2: Computer-Controlled, 0.05 mm - 20 mm, 0.01 mm step

• Kβ Filter: Nickel for Cu Radiation

6 1

CHILLER-

PENDING

Heat Exchanger (Air Cooled or Water Cooled) Water chiller system for cooling of the Anode.

7 1 1022396 Incident Beam Optics CBO-α with Flat Mirror

Conventional Bragg-Brentano & Monochromatic Bragg- Brentano Optics from Flat Mirror

• Incident beam flat multilayer x-ray mirror.

• Automatic mirror control and alignment.

• CBO Selection Slits: CBO-α Bragg-Brentano

• Variable Divergence Slit: 0.05 – 7.0mm, 0.01mm step

8 1 2455G301 ASC- 48 Automatic Sample Changer

• Target System: SmartLab Step 2 Powder System

• Stage: 48 positions

• 2-theta range: 3.2 – 162 deg. (Maximum angle may vary according to the system configuration)

• Spin Axis: 360deg rotation

• Sample Spinner with Spin Speed: 60 – 120 rpm

• Sample Holders: Rectangular, same as Standard sample stage

Includes

• ASC-48 Automatic Sample Changer

• 50 – Glass Sample Holders (5 sets of 10), 35mmW x 50mmH with 0.5mm indent (9200/5G)

9 1 902712 Extra Magazine for ASC-48 - Holds 24 pcs

10 48 1017494 Sample Holder, Ag Membrane, Rect, ASC48

11 1 1023551 D/teX Ultra 250 High Speed Silicon Strip 1D Detector

• Compound Silicon Strip 1D Detector

• Active Area: 19.2mm x 20mm = 384mm2

• Channels: 256 silicon strips

• Pixel Size: 75μm

• Count Rate: 250,000,000 cps (1 x 106 cps/pixel) needs to say 10 to the 6th power

• Energy Resolution: 20% @ Cu Kα

• Programmable discrimination settings for suppression of fluorescence

• Dimensions: 65(W)×107.5(H)×83(L)mm

12 1 PC-XRD Computer Configuration for X-Ray Diffraction

PC Computer for instrument control and data processing.

• Intel Core™ i7 Processor

• 32.0 GB RAM minimum

• Dual-band 802.11ac Wi-Fi with Bluetooth 5

• Internal Audio Speaker

• 24” Dell Flat Panel LCD

• Dual Monitor Capability

• 512 GB hard drive minimum, SSD

• 8X DVD+/-RW, 9.5 Optical Disk Drive

• 4 USB ports minimum, 2 on the front, 2 on back

• 6 USB3 ports 2 on the front, 4 on the back

• Keyboard, USB 2 Button Scroll Mouse and Pad

• Microsoft Windows 10 PRO, upgradeable with a 64 bit minimum

• MS Office 2021 Home and Business

• Adobe Acrobat Reader

• Color Printer with Cable

• Two (2) Ethernet Ports required

• 3 year Basic Limited Warranty, 3 year NBD On-Site Service from Dell

13 1 A00009058 SmartLab Studio II Software – Ten (10) User Network License

XRD Measurement Plugin

• Instrument control, system status, and device configuration.

• Optical recognition and graphical display of optical system configuration.

• Measurement center for all user defined measuring conditions.

Data Manager Plugin

• No redundant login screens with automatic login.

• Data files shown in thumbnail images or detailed information displays.

• Available data analysis programs are highlighted for selected data files.

• Find data based on data type, date, owner, etc.

SmartLab Guidance™

Configuration

• Fully automatic system alignment

• Goniometer and detector settings

• Attachment configuration definitions

• Optics definitions

Manual Measurement

• Enables user control the goniometer and attachment axes as well as setting of the detector high voltage.

• Used to check system alignment.

• May be used to perform simple measurements.

Standard Measurement

• Allows up to fifty different sets of measurement conditions to be defined by the user. These conditions are stored for later use and can be edited.

• Multiple measurement conditions can be applied to the sample and up to six samples can be measured when using the optional sample changer.

• Real-time data display is provided along with the ability to suspend or abort running measurements

Included with Software

• SmartLab Studio II recipe compatibility.

• Application wizards.

• Optical recognition of instrument configuration in real time with virtual goniometer display.

• SmartMessages to guide user to add or remove optical components, sample stages, and accessories.

• Conflict detection with specific component identification to ensure optimal hardware set up every time.

• Control of (optional) programmable temperature controller for user-programmed heating and cooling profiles.

14 1 1020506 SmartLab Studio II Powder Basic Analysis Plugin

Display Features

• Zoom, reset, and pan.

• Multiple pattern overlays in 2D and 3D.

• Hiding analysis results to show raw data only.

• Switching 2 theta axis to S or Q.

• Customizing line colors, widths, and markers.

• Windows clipboard support for copy and pasting into other applications.

• Thumbnail viewing.

• Drag and drop from Explorer.

• Access to your ICDD database for overlays and card printing.

• View crystal structures in 3D with real-time manipulation.

Data Reduction Features

• Automatic data reduction and peak list reporting.

• Sonneveld-Visser and polynomial function background elimination.

• Rachinger method Kα2 elimination.

• Automatic and/or manual peak finding.

• Peak-top and second-derivative peak finding.

• Gaussian moving average, Savitzky-Golay, optimized Gaussian moving average, and B-spline smoothing.

• Beam footprint and absorption corrections for variable slit.

• Absorption correction for capillary.

• LP correction for monochromators.

Data Analysis Features

• Simultaneous processing of multiple patterns.

• Automatic individual parameter fitting.

• RIR quantitative analysis using imported phase information.

• Crystallite size determination using a single diffraction peak (Scherrer’s equation) with and without an external standard reference material.

• Boolean search of ICDD PDF databases

Data Input/Output Features

• Universal ASCII pattern file import and export.

• Detailed processing logs.

• Import/export d-I and IUCr CIF files.

• Microsoft Word report file creation.

• Online PDF manual.

• Easy creation & management of searchable database from ICDD & user defined phases

• d-I list editing and file import

15 1 1020507 SmartLab Studio II Powder Comprehensive Analysis Plugin

Crystallinity determination module

• % Crystallinity determination using whole pattern fitting.

Crystallite size and lattice strain determination module

• Instrumental broadening deconvolution using internal or external standard reference material.

Cell refinement module

• Cell refinement using internal or external standard reference material.

• Standardless cell refinement using theoretical systematic error correction.

• Plots of cell refinement results for multiple samples or measurement conditions.

16 1 1020508 SmartLab Studio II Powder Qualitative (Search) Analysis Plugin

Search Match Features

• Interface to COD and ICDD PDF2/PDF4+ databases.

• Provisions to carry sample information such as chemistry, cell constants, density, etc. in the user file.

• Powerful line and profile-based hybrid search/match algorithm, with before/after chemistry filter, control of sensitivity to lattice parameter, focus on minor phases, and consideration of preferred orientation.

• GUI result display with the d-I overlay tools.

• Independent GUI result display with zoom and pan support.

• “Flexible cell” algorithm for solid solution and iso-typical phases.

• Residual display & repeat of search/match with specified peaks.

• Automatic selection of best FOM phases.

• Sort and tree display on similarity for simple phase identification.

17 1 A00009289 SmartLab Studio II Powder Respirable Silica Quant Plugin

This plugin enables quantitative analysis for Respirable Silica and Asbestos.

Features

• Quantitative analysis for small amount of crystal in accordance with NIOSH 7500/9000, OSHA ID-142, JIS A 1481- 3 using Base Standard Absorption correction methods.

• Intensity correction with time by intensity standard.

• Draw calibration curves (Liner, Square root, and Logarithmic scale)

• Switch the content unit (mg, μg) and display rate of the content towards base material/environment volume.

• Calculate/display lower limit of detection and lower limit of quantitation.

• Apply for quantitative analysis with multiple peaks.

18 1 COD Crystallography Open Database (COD)

Database Features

• Free of charge download of the COD open database

• Free renewals

• The database founded in February 2003 contains > 100,000 entries.

• Inorganic, metal–organic, organic phases

• CIF format

• MySQL/PHP scripts

19 1 Training Applications Training onsite at Agency

• Applications training at Agency location for 3 – 5 Agency staff

• 3-days by a Rigaku Applications Scientist. Dates to be determined and mutually agreed upon

• Training will cover basic diffraction physics, instrument operation, data reduction, and data analysis.

• Training must be completed within 90 days after installation.

• Travel Expenses should be included in cost of equipment

20 1 Delivery Delivery: FOB Destination

21 1 Installation Installation at Agency Location

• Date and time to be determined and mutually agreed upon

22 1 Warranty Equipment: One Year Warranty included with purchase

• One Year Parts and Labor on X-ray Diffraction System

Rigaku guarantees parts will be available for 10 years from the date last unit manufactured

• Dell computer components should have a minimum three year Basic Limited Warranty and three NBD On-Site Service for computer components

23 Service Standard Service after Warranty

Services Includes:

• Parts and Labor, Preventive Maintenance and Repair Service

• Standard System Parts (no consumables) including shipping included. Parts to be shipped FOB destination.

• Return of defective parts if applicable. Defective parts to be shipped FOB destination

• Preventive maintenance service visit per maintenance contract period.

• one (1) anode rebuild (includes rebuild kit, anode cup (Cu only), balancing, labor and shipping) per generator during the contract period.

• 72 hour on site service response during business hours, Monday through Friday 8:00 A.M. to 5:00 P.M. Pacific Time

• Onsite emergency repair service as deemed necessary by a qualified Rigaku Service Representative

• Technical telephone support during business hours, Monday through Friday 8:00 A.M. to 5:00 P.M. Pacific Time Note: Agency reserves the right to negotiate time zone based on Contractor’s location

• Remote Support to assist Agency users with simple tasks such as simple alignments, diagnose system faults and troubleshoot software programs

Travel

Any travel costs, if applicable, will be negotiated separately with the awarded Contractor