Latest_Responses_to_Questions.docx

DOCX document 14 KB Posted

Attached to
Wafer Probing System Federal contract opportunity
Solicitation number
NB687090-16-02510
Issued by
Department of Commerce National Institute of Standards and Technology

View the file

Other files for this federal contract opportunity

Other files attached to Wafer Probing System, newest first.
File Type Posted
2nd_Responses_to_Questions.docx DOCX document
Answers_to_Questions.pdf PDF
Specifications.docx DOCX document

On GovTribe

Work with this file on GovTribe

  • Download the original file
  • Contacts named in this file
  • Similar government files
  • Ask GovTribe AI about this file
Try for free Login

Text version

The file's text, extracted by GovTribe without its formatting.

Latest Responses to Questions:

Is there any requirement to be able to use needle probes controlled by a manipulator and probe arm sitting on the platen while the probe card is in use while subjecting magnetic field?

-No

File details come from the government source that posted it. Updated .