Latest_Responses_to_Questions.docx
DOCX document 14 KB Posted
- Attached to
- Wafer Probing System
- Solicitation number
- NB687090-16-02510
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Other files
| File | Type | Posted |
|---|---|---|
| 2nd_Responses_to_Questions.docx | DOCX document | |
| Answers_to_Questions.pdf | ||
| Specifications.docx | DOCX document |
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Latest Responses to Questions:
Is there any requirement to be able to use needle probes controlled by a manipulator and probe arm sitting on the platen while the probe card is in use while subjecting magnetic field?
-No
File details come from the government source that posted it. Updated .