2nd_Responses_to_Questions.docx

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Attached to
Wafer Probing System Federal contract opportunity
Solicitation number
NB687090-16-02510
Issued by
Department of Commerce National Institute of Standards and Technology

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Latest_Responses_to_Questions.docx DOCX document
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3rd Amendment for Responses to Questions:

Is the magnetic field required to be used in conjunction with the probe card?

-yes

Or, is its presence only required during manual positioning mechanics probing requirements.

-no

Also, are there any requirements to use positioning mechanics in conjunction with the probe card?

-Yes, the probe card should be able to be aligned to ensure planarity of the probe tips with the wafer.

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