TESCAN Scanning Electron Microscope (SEM) Service Maintenance Agreement

Closed Special Notice Posted

Solicitation number
FA860125Q0117
Agency
AFLCMC Wright Patterson AFB Lifecycle Management Center, Department of Defense
Responses due
Set-aside
No set-aside

Opportunity facts

NAICS code
811210 Electronic and Precision Equipment Repair and Maintenance
PSC
J066 Maint/Repair/Rebuild Of Equipment- Instruments And Laboratory Equipment
Place of performance
Wright Patterson AFB, Ohio 45433, United States
Points of contact

Notice details come from SAM.gov. Updated .

About this opportunity

The United States Air Force, through the Air Force Life Cycle Management Center (AFLCMC) at Wright-Patterson Air Force Base, has issued a Special Notice for a sole source procurement of a TESCAN Scanning Electron Microscope (SEM) Service Maintenance Agreement. This notice serves as both a sole source synopsis and solicitation for maintenance services for a TESCAN MAIA SEM located at the Air Force Institute of Technology (AFIT) at Wright-Patterson Air Force Base. The procurement is being conducted under NAICS code 811210 for Electronic and Precision Equipment Repair and Maintenance, with a small business size standard of $34 million. The intended sole source vendor is TESCAN USA, Inc., located in Warrendale, Pennsylvania, as they are determined to be the only vendor capable of fulfilling the government's specific maintenance requirements. The estimated contract value is $31,868 for this firm-fixed-price procurement.

The purpose of this Special Notice is to provide comprehensive maintenance and repair services for the specialized electron microscope, including preventive and remedial maintenance with a 48-hour emergency response requirement and five-day service completion standard. While this is intended as a sole source procurement, the government has provided an opportunity for other responsible sources to submit capability statements, proposals, or exceptions to the sole source approach by the July 25, 2025 deadline. Contractors must be registered in the System for Award Management (SAM) and maintain active registration throughout the contract period. The government previously conducted market research through a Sources Sought notice posted on June 2, 2025, with no alternative capabilities received by the June 17, 2025 deadline. All inquiries must be submitted via email to the designated contracting officer with the specific subject line "TESCAN Scanning Electron Microscope (SEM) Service Maintenance Agreement" and only PDF, DOC, or XLS file attachments are acceptable.

Notice text

INTENT TO SOLE SOURCE

United States Air Force, AFLCMC/PZIBA, Wright-Patterson AFB, Ohio 45433-5344

This is a combined Sole Source Synopsis/Solicitation published for informational purposes only. This proposed action is for the acquisition of one (1) TESCAN Scanning Electron Microscope (SEM) Service Maintenance Agreementfor Wright Patterson Air Force Institute of Technology (AFIT) located at 2950 Hobson Way Wright-Patterson AFB Ohio 45433. It was determined that TESCAN USA, Inc., can meet the Government’s specifications in the attached Performance Work Statement (PWS). The Government intends to solicit and negotiate with only one source under the authority of FAR 13.106-1(b)(1), resulting in a Firm-Fixed-Price contract.

The proposed procurement will be a Sole Source under North American Industry Classification Systems (NAICS) Code # 811210 Electronic and Precision Equipment Repair and Maintenance, with a small business size standard of 34 million dollars. The proposed source TESCAN USA, Inc., located at 765 Commonwealth Dr. STE 101 Warrendale, PA 15086-7620 is the only vendor capable of fulfilling the requirements outlined in the PWS. This notice of intent is not a request for competitive quotations. However, all responsible sources may submit a capability statement, proposal, quotation, or exception to the intent to purchase on a sole source basis, which shall be considered by the Government if received prior to the closing of this notice. Information received will normally be considered solely for the purpose of determining whether to conduct a competitive procurement.

In order to comply with FAR 5.207(c)(15), the reason for lack of competition is as follows: TESCAN USA, Inc. is the only vendor capable of fulfilling the requirements outlined in the PWS for one (1) TESCAN Scanning Electron Microscope (SEM) Service Maintenance Agreement. Therefore, it is in the best interest of the Government to award to TESCAN USA, Inc. Please see Attachment 2, Sole Source Justification, for more complete details.

Important Notice to Contractors: All prospective awardees are required to register at the System for Award Management (SAM) and to maintain active registration during the life of the contract. SAM can be accessed at https://www.sam.gov.

Any information should be emailed to brian.algeo.1@us.af.mil. Only inquires/information received through email by this notice date will be considered. Be advised all correspondence sent via email shall contain a subject line that reads “TESCAN Scanning Electron Microscope (SEM) Service Maintenance Agreement.” Note that email filters at Wright-Patterson AFB are designed to filter emails without subject lines or with suspicious subject lines or contents (i.e.: .exe or .zip files). Also, be advised that .zip or .exe files are not allowable attachments and may be deleted by the email filters at Wright-Patterson AFB. If sending attachments with the email, ensure only .pdf, .doc, .xls documents are sent.  

Attachments:

  1. Performance Work Statement (PWS)
  2. Sole Source Justification (SSJ) Redacted

Attachments

Files attached to this notice, newest first
File Type Posted
TESCAN_SSJ_Redacted.pdf PDF
Performance Work Statement - TESCAN.pdf PDF

Notice history

Notices posted for this opportunity, newest first
Notice Type Posted
TESCAN Scanning Electron Microscope (SEM) Service Maintenance Agreement This notice · Latest special notice Special Notice
Tescan scanning electron microscope (SEM) preventative maintenance and repair Original Pre-Solicitation

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