Solicitation for purchase of Semi-Automated Probe Station (CHIPS)

Closed Solicitation Posted

This opportunity was awarded. See the award notice from .

Solicitation number
1333ND25QNB030150
Agency
Responses due
Set-aside
Total Small Business

Opportunity facts

Place of performance
Gaithersburg, Maryland 20899, United States

Notice details come from SAM.gov. Updated .

About this opportunity

The National Institute of Standards and Technology (NIST) is seeking to procure a Semi-Automated Probe Station for the CHIPS R&D Program Office to support research on silicon carbide field effect transistors. The solicitation requires a 200 mm, ultra-dry, semiautomatic wafer probing station capable of handling precise measurements and testing ultra-low gate leakage currents. Evaluation of potential contractors will be based on three factors: Technical Capability, Relevant Experience, and Price, with Technical Capability and Relevant Experience being equally weighted against Price. Interested offerors must submit a comprehensive electronic quotation in four volumes by 11:00 AM Eastern Time on May 09, 2025, to Forest Crumpler and Donald Collie at their NIST email addresses. The solicitation strictly requires new, commercial items and will not accept used or refurbished instruments.

This procurement is a 100% small business set-aside under NAICS category 334516 for Analytical Laboratory Instrument Manufacturing, with a small business size standard of 1,000 employees. The contract will be awarded as a firm-fixed-price agreement for a single Semi-Automated Probe Station, including training, installation, and delivery to NIST's location in Gaithersburg, MD. Delivery is expected within 24 weeks after order receipt, with a three-year warranty included. The payment structure is phased, with 25% due upon draft plan acceptance, 50% upon delivery, and the final 25% after successful performance tests. The system must meet specific technical requirements, including pattern recognition probing, ability to handle probe pad sizes as small as 40 m x 40 m, a heated wafer chuck reaching 200C, and operation in an ultra-dry environment with less than 1 part per million H2O.

Notice text

2 versions

Update #2 · Latest ·

***** Amendment 1

This amendment is intended to answer questions that have been asked.  Along with the answers to questions, the response date has also been extended from May 9, 2025 to May 14m 2025.

Q&A

Question 1:  Chuck temperature –

Ultra-dry environment – a 1ppm H20 measurement equates to a -76C dew point, which we accomplish with our CDA and a chuck temperature that has a -60C temperature.  Can you confirm if any testing will be done at negative temperatures or just ambient to 200C?

Answer 1: Tests will only be conducted from ambient to 200 C. It does not matter to us what temperature the chuck is at during the drying phase, provided that we can transfer the wafer from a staging area within the chamber to the chuck at ambient or above.

Question 2:  Wafer handling

For the sample staging area and 8 hours to reach ultra-dry conditions from ambient and allow samples to be loaded… 

Wafer exchange can be accomplished with our normal rollout chuck, but the process of opening the chamber and changing wafers will require time to reach the dew point. 

An automatic exchange into a maintained low dewpoint can only be accomplished with a fully automatic probe stations with a 25 wafer cassette and our material handling unit (MHU). 

Please confirm semi-automatic vs. automatic probing with regard to changing wafers.

Answer 2: The probing station should be semi-automatic. The 8 hours references the time from closing the chamber (with sample(s) inside) to reaching a <1ppm H2O environment. If 8 hours is not possible, please ask them to provide an estimated time that they can achieve.

End of Amendment 1 *****

Please see attached solicitation document for full details.

Please note that this is 100% set-aside for small business.

Update #1 ·

Please see attached solicitation document for full details.

Please note that this is 100% set-aside for small business.

Files

File Type Posted
Attachment 1- Statement of Work.pdf PDF
1333ND25QNB030150.pdf PDF

Notice history

Notice Type Posted
Award Notice for purchase of Semi-Automated Probe Station (CHIPS) Award Award Notice
This notice Latest solicitation Solicitation

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