Notice Of Intent to Sole Source for Probe Station for CMOS Measurements
Closed Special Notice Posted
This opportunity was awarded. See the award notice from , or the latest solicitation from .
- Solicitation number
- NB681050-24-02221
- Agency
-
National Institute of Standards and Technology
Department of Commerce
- Responses due
- Set-aside
- No set-aside
Opportunity facts
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- Place of performance
- Gaithersburg, Maryland 20899, United States
- Points of contact
Notice details come from SAM.gov. Updated .
About this opportunity
The National Institute of Standards and Technology (NIST) has published a Notice of Intent to Noncompetitively acquire a probe station for CMOS (Complementary Metal-Oxide-Semiconductor) measurements. This special notice is being issued under the authority of FAR 13.106-1(b) and falls under the North American Industry Classification System (NAICS) code 334516 - Analytical Laboratory Instrument Manufacturing.
The purpose of this acquisition is for NIST's Biophysics and Biomedical Measurements Group to obtain a probe station that meets specific requirements, including a 200 mm semi-automatic chuck, motorized 4-axis stage, PC-based control software, and a microscope and machine vision system. This probe station will be used for DC and low-frequency (< 10 MHz) measurements, such as current vs. voltage (IV) and capacitance vs. voltage (CV) measurements of CMOS devices designed for biophysical measurements. NIST does not intend to issue a solicitation document or request quotations, as this is a sole-source acquisition. There are no set-aside requirements, and the government has not provided any additional programs, initiatives, or opportunities in this Special Notice.
Notice text
Notice of Intent to Noncompetitively acquire a probe station for CMOS Measurement. (See attached for full details).
Files
| File | Type | Posted |
|---|---|---|
| NOI SS Probe Station.pdf |
Notice history
| Notice | Type | Posted |
|---|---|---|
| Probe Station for CMOS Measurements - Award Notice | Award Notice | |
| Probe Station for CMOS Measurements - Combined Synopsis/Solictation | Solicitation | |
| This notice | Special Notice | |
| Probe Station for CMOS Measurements - Sources Sought Notice | Pre-Solicitation |
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