Laser System for Terahertz Spectroscopy and Imaging
Closed Pre-Solicitation Posted
This opportunity was awarded. See the award notice from , or the latest solicitation from .
- Solicitation number
- NB6831202301852
- Agency
- National Institute of Standards and Technology Department of Commerce
- Responses due
- Set-aside
- No set-aside
Opportunity facts
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- PSC
- 6640 Laboratory Equipment And Supplies
- Place of performance
- Gaithersburg, Maryland 20899, United States
Notice details come from SAM.gov. Updated .
About this opportunity
The National Institute of Standards and Technology seeks to procure a high-power, high repetition-rate femtosecond laser system for terahertz spectroscopy and imaging applications. The system must provide pulse power up to MHz repetition rates for terahertz probe generation and detection to achieve high signal-to-noise capability for pump-probe and carrier dynamics measurements. It must also include an optical parametric amplifier. Vendors must demonstrate their ability to meet or exceed the provided draft minimum specifications by November 1, 2022. The laser system will advance non-contact carrier information and thermal property measurements of nanoscale device structures for the agency.
There is no set-aside designation for this procurement. The laser system falls under NAICS code 334510 and PSC code 6625. Vendors must submit information demonstrating their ability to provide a commercial item solution that meets or exceeds the specifications by the November 1st deadline. The pre-solicitation notice does not provide budget ranges or quantity details.
Notice text
THIS IS A SOURCES SOUGHT NOTICE. PLEASE SEE ATTACHMENT FOR COMPLETE NOTICE DETAILS AND SUBMISSION INSTRUCTIONS.
GENERAL DESCRIPTION: High Power, High Repetition Rate Laser System for Terahertz Spectroscopy and Imaging
The National Institute of Standards & Technology (NIST) seeks information on vendors that can provide a commercial compact high-repetition rate, high-power femtosecond laser system for Terahertz (THz) thermal IC imaging and Near-Field Scattering-Optical Microscopy (s-SNOM). The system shall provide sufficient pulse power for THz probe generation and detection up to MHz repetition rates to achieve highest signal-to-noise capability for pump-probe and carrier dynamics measurements. Includes an Optical Parametric Amplifier (OPA) for tunable visible, ultraviolet and/or mid-IR pulse generation for transient absorption and fluorescence and related ultrafast spectroscopy experiments. Terahertz imaging and spectroscopy projects fall within the Nanoscale Device Characterization Division mission by providing novel measurement capabilities for 3D integrated circuits and optically determine carrier dynamics and mobility of nanoscale material features. These measurements complement other nanoscale metrologies but will advance non-contact carrier information and thermal properties within device structures.
NIST is seeking information from sources that may be capable of providing a commercial item solution that meets or exceeds the draft minimum specifications in the attached.
Attachments
| File | Type | Posted |
|---|---|---|
| 23-01852 Sources Sought.pdf |
Notice history
| Notice | Type | Posted |
|---|---|---|
| High Power, High Repetition Rate Laser System for Terahertz Spectroscopy and Imaging | Award Notice | |
| High Power, High Repetition Rate Laser System for Terahertz Spectroscopy and Imaging | Solicitation | |
| Laser System for Terahertz Spectroscopy and Imaging | Pre-Solicitation |
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