KLA P-7 Stylus Profilometer

Closed Solicitation Posted

Solicitation number
HQ072724QNR02
Agency
Responses due
Set-aside
No set-aside

Opportunity facts

Place of performance
McClellan, California 95652, United States

Notice details come from SAM.gov. Updated .

About this opportunity

The Defense Microelectronics Activity (DMEA) has issued a solicitation for the procurement of a KLA P-7 Stylus Profilometer and related peripherals. The profilometer is required to provide topographical metrology capabilities, including the measurement of features such as trenches, vias, surface roughness, wafer shape, and film stress. The solicitation outlines detailed technical requirements, including automated motorized stage, wafer bow/stress measurement, continuous 150mm wafer scans, 3D and contour analysis software, and compatibility with an ISO class 5 cleanroom environment. The contract will be awarded as a firm-fixed-price on a best value basis to the responsible offeror. Quotes are due by 3:00 PM Pacific Standard Time on May 21, 2024.

The solicitation does not specify any set-aside designations. The PWS does not provide details on any incumbent contractors or potential award values. The place of performance is McClellan Park, CA 95652, USA, and the period of performance is 12 months after delivery of the equipment.

Notice text

Please see attachments.

Files

File Type Posted
Combined Synopsis and Solicitation HQ072724QNR02.pdf PDF
JA PWS 24-4F6 - Redacted.pdf PDF
24-4F6 PWS KLA P-7.pdf PDF

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