Handheld XRF

Closed Solicitation Posted

This opportunity was awarded. See the award notice from .

Solicitation number
SP4706-26-Q-0012
Agency
Responses due
Set-aside
No set-aside

Opportunity facts

Place of performance
Columbus, Ohio, United States

Notice details come from SAM.gov. Updated .

About this opportunity

The Defense Logistics Agency seeks a handheld XRF analyzer for quantitative and qualitative chemical analysis of metals, alloys, plating type and thickness, with proposals due July 8. The procurement is a small business set-aside with SDVOSB eligibility for the WOSB program.

Place of performance is Columbus, Ohio. The device must not exceed 12 inches length by 5 inches width by 12 inches height, weigh no more than 4.5 pounds including battery, and include a high-resolution silicone drift detector, X-ray tube with silver or rhodium anode, X-ray generator rated 6–50 kilovolt with 0–200 ampere and 4-watt output, minimum 4-position filter wheel, 3-millimeter collimator spot size, element detection from magnesium to uranium, color touchscreen display, minimum 100-reading data storage, integrated camera with 5-image minimum storage, and software with PC compatibility incorporating calibration packages for General Metals, Precious Metals, Coatings, Mining, Electronic Alloys, and Plastics applications. The contractor must provide one-day onsite installation, setup, calibration, and training for up to five DLA employees; instrument certification with NIST traceable ANSI/NCSL Z540.1 documentation; and service availability 6:00 a.m. to 7:00 p.m. Monday through Friday. Two-year warranty covers parts, labor, and travel. Period of performance is 120 days from award. Pricing includes shipping and delivery to Columbus. NAICS code is 334516, Analytical Laboratory Instrument Manufacturing. PSC code is 6640, Laboratory Equipment and Supplies. Delivery is required by October 14. Contracting officer is Jacob Combs, 445-737-0398.

Notice text

This requirement is to aqcuire Handheld Portable XRF Analyzer. This equipment is used for quantitative and qualitative chemical analysis of metals and alloys as well as plating type and thickness. It is non-destructive, unless surface preparation is required, and is a necessary to expand testing capabilities and determining the composition of metal alloys, coatings, and measuring coating thickness.

Please refer to the Statement of Work (SOW), an attachment to the solicitation, for technical specifics for this requirement.  

Files

File Type Posted
SF1449_SP470626Q0012.pdf PDF
SOW.pdf PDF

Notice history

Notice Type Posted
Handheld XRF Award Award Notice
This notice Latest solicitation Solicitation
Handheld XRF Original Pre-Solicitation

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