CHIPS Direct Electron EBSD
Closed Solicitation Posted
This opportunity was awarded. See the award notice from .
- Solicitation number
- 1333ND24QNB030278
- Agency
-
National Institute of Standards and Technology
Department of Commerce
- Responses due
- Set-aside
- No set-aside
Opportunity facts
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- PSC
- 6640 Laboratory Equipment And Supplies
- Place of performance
- Gaithersburg, Maryland 20899, United States
Notice details come from SAM.gov. Updated .
About this opportunity
The National Institute of Standards and Technology (NIST), part of the Department of Commerce, is seeking proposals for a new SEM analytical detector system, including a direct electron EBSD detector, to be installed on an existing NIST-owned JEOL 7800 SEM. The key requirements include detector resolution, energy filtering, scan rates, control software, and integration with the existing SEM. An optional integrated Energy Dispersive X-ray Spectrometer (EDS) detector is also described. Proposals will be evaluated based on technical capability, past performance, experience, and price, with technical capability being the most important factor. Quotations are due by 11:00 AM ET on August 19, 2024.
This is a total small business set-aside solicitation using simplified acquisition procedures under FAR Part 13.5. No incumbent contractors are named. The contract is a single firm-fixed-price purchase order with delivery and installation required within 14 weeks of award. The work is to be performed at the contractor's facility, with installation and training at the NIST Gaithersburg, MD campus.
Notice text
2 versions
Update #2 · Latest ·
Amendment 0001: Dissolve small business set-aside, Update SOW, Update the Solicitation, and Extend response date to August 19, 2024. The reason for this amendment is that the action was indicated as a small business set-aside in error and included some SOW requriements that are unclear. See updated attachments.
See attachments 1333ND24QNB030278 RFQ & Statement of work for soliciatin details.
Update #1 ·
See attachments 1333ND24QNB030278 RFQ & Statement of work for soliciatin details.
Files
| File | Type | Posted |
|---|---|---|
| 1333ND24QNB030278 RFQ_Amended.docx | DOCX document | |
| Statement of Work._Updated.docx | DOCX document | |
| Statement of Work.docx | DOCX document | |
| 1333ND24QNB030278 RFQ.docx | DOCX document |
Notice history
| Notice | Type | Posted |
|---|---|---|
| CHIPS Direct Electron EBSD | Award Notice | |
| This notice | Solicitation | |
| Scanning Electron Microscope (SEM) Analytical Detectors including Direct Electron EBSD | Pre-Solicitation |
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