Scanning Electron Microscope (SEM) Analytical Detectors including Direct Electron EBSD

Closed Pre-Solicitation Posted

This opportunity was awarded. See the award notice from , or the latest solicitation from .

Solicitation number
NIST-SS24-CHIPS-0002
Agency
Responses due
Set-aside
No set-aside

Opportunity facts

Place of performance
Gaithersburg, Maryland 20899, United States

Notice details come from SAM.gov. Updated .

About this opportunity

The National Institute of Standards and Technology seeks analytical detectors for a scanning electron microscope, including a direct electron backscatter diffraction detector, silicon drift detector, and integrated control and data analysis software. Responses are due January 25, 2024 and must include detectors meeting minimum specifications, company and product information, capabilities, terms and conditions, manufacturing details, and references without proprietary data. The agency will consider responses as part of market research for a future solicitation.

There is no set-aside designated for this opportunity. Key numerical specifications for the direct electron backscatter diffraction detector include 512x512 pixel resolution and a 85 patterns per second collection rate. The silicon drift detector must have at least 70mm^2 active area and 700 kcps count rate. Responses will aid the agency's market research prior to releasing a future solicitation for these analytical detectors and associated software and services.

Notice text

Please See Attachment.

Files

File Type Posted
EBSD SSN.docx DOCX document

Notice history

Notice Type Posted
CHIPS Direct Electron EBSD Award Award Notice
CHIPS Direct Electron EBSD Latest solicitation Solicitation
This notice Original Pre-Solicitation

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