Scanning Electron Microscope (SEM) Analytical Detectors including Direct Electron EBSD

The National Institute of Standards and Technology seeks analytical detectors for a scanning electron microscope, including a direct electron backscatter diffraction detector, silicon drift detector, and integrated control and data analysis software. Responses are due January 25, 2024 and must include detectors meeting minimum specifications, company and product information, capabilities, terms and conditions, manufacturing details, and references without proprietary data. The agency will consider responses as part of market research for a future solicitation.

There is no set-aside designated for this opportunity. Key numerical specifications for the direct electron backscatter diffraction detector include 512x512 pixel resolution and a 85 patterns per second collection rate. The silicon drift detector must have at least 70mm^2 active area and 700 kcps count rate. Responses will aid the agency's market research prior to releasing a future solicitation for these analytical detectors and associated software and services.