Tab 04 SOW.pdf

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PerkinElmer Spectrum 3 Dual Range Spectrometer OR EQUIVALENT
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80NSSC27944070Q
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This Statement of Work outlines NASA Langley's requirement to acquire a PerkinElmer Dual Range Mid-Infrared (MIR) Fourier Transform Infrared (FTIR) Spectrometer or equivalent. The acquisition includes eight line items: the spectrometer itself (L1280138), a power cord, a Dell i5 computer, a 24-inch Dell monitor, Spectrum 10 software, an FRT/SP3 UATR accessory, a NIRA II Reflectance Accessory, and a NIRA II 60mm Spinner Accessory. The delivery location is NASA Langley Research Center, Building 1146, Hampton, VA 23185, with a performance period of 30 days after receipt of order (ARO).

The spectrometer must be capable of measuring sample absorption and transmission across 14,700 to 350 cm⁻¹ on a common platform with automated range switching between MIR and NIR without sample movement or accessory switching. Key design requirements include ISO 9001 certification, a rotary interferometer, sealed and desiccated optics, kinematically mounted zero-alignment optics, electronic stabilization of the mid-IR source, two temperature-stabilized DTGS detectors, and a 7-position automated optical filter wheel with validation materials. Performance specifications require Signal-to-Noise ratios of better than 50,000:1 RMS at 4 cm⁻¹ resolution and 174,000:1 RMS for one-minute acquisition times, wavenumber precision of 0.008 cm⁻¹, and wavenumber accuracy of 0.02 cm⁻¹. The base system must not exceed 100 lbs and fit within 25 inches in depth or width. The system shall include intelligent ATR and NIR reflectance accessories with automatic recognition, optimization, and pressure sensing capabilities, plus options for additional accessories including transmission cells, heatable transmission accessories, autosamplers, and fiber optic probes compliant with ATEX standards for hazardous environments.

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STATEMENT OF WORK

1. Objective/Requirements

The NASA Langley has a requirement for a PerkinElmer Dual range Mid-infrared (MIR) Fourier transform infrared (FTIR) Spectrometer BRAND NAME OR EQUAL.

2. Characteristics, Scope, and Specs

LINE PART NO. DESCRIPTION QTY.

1 L1280138 OR EQUAL Spec 3 Dual MIR/NIR KBr/CaF2 OR

EQUAL

2 09991420 OR EQUAL NA Power Cord – 14AWG 2M

125V 15A OR EQUAL

3 09405149 OR EQUAL PC -XE5 DELL i5 NA OR EQUAL 1 4 09406426 OR EQUAL 24inch monitor - Dell (ADC) OR

EQUAL

5 LX108873 OR EQUAL SOFTWARE KIT- SPECTRUM 10

OR EQUAL

6 L1280301 OR EQUAL FRT/SP3 UATR 1 BOUNCE OR

EQUAL

7 L1280450 OR EQUAL NIRA II Reflectance Accessory OR

EQUAL

8 L1280410 OR EQUAL NIRA II 60mm Spinner Accessory OR

EQUAL

Purpose of Acquisition The purpose of this acquisition is to acquire a dual range mid-infrared (MIR)/near-infrared (NIR) Fourier transform infrared (FTIR) spectrometer capable of measuring sample absorption and transmission over the range of 14,700 to 350 cm-1 on a common spectrometer platform. This instrument should be capable of automated range switching to measure the MIR and NIR transmission without requiring any movement of the sample or accessory switching which introduces measurement error and uncertainty. This instrument must also include ATR and NIR reflectance accessories. The system should also be capable of future upgrade capabilities such as additional sampling accessories and a heatable transmission accessory.

Spectrometer Design

• The manufacturer shall have ISO 9001 certification for the design, manufacture, and service of the FTIR instrument.

• The system shall offer Mid and Near–IR on a common spectrometer platform.

• Development of both MIR and Near methods on a common spectrometer platform helps comparison between alternative sampling techniques and measurement conditions

• The spectrometer shall utilize a rotary interferometer providing inherent immunity to mirror tilt and shear and require no scanning mirror dynamic alignment. Dynamically aligned interferometers are not acceptable due to their inherent poor parallelism and lack of stability, and corner cube designs are not acceptable due to their inherent alignment complexity.

• The system shall include automated range switching between Mid and Near-IR measurements to further increase ease and productivity. Automated range switching shall enable single button range change incorporating automatic change of source, beamsplitter and detector.

• Automated range switching changes the spectral range from Mid to Near-IR and the optics are never exposed to air and no re-stabilization is required

• The spectrometer shall allow the full range of MIR and Near to be observed without having to expose the beamsplitter and internal spectrometer optics to atmosphere.

This alone will save users 30-45 minutes of re-equilibrate time while switching from one spectral range to another. Unstable compounds may decompose and produce unreliable data during that unnecessary delay.

• Changing the system from Mid-IR to Near-IR shall be accomplished without removing the sample from the sample compartment or accessory.

o Removing the sample from the sample compartment or accessory introduces another level of uncertainty when looking to run the same sample (with the same conditions) in different wavelength ranges.

• Beamsplitter changeover shall be performed without the recommendation that users remove samples and/or accessories to perform auto-alignment.

o Re-alignments and auto-alignments that recommend that the sample and/or the sample accessory be removed from the sample compartment lead to uncertainty of sample position and additional equilibration time of 30-45 minutes.

• The system shall share a common optical design and sampling accessories with the vendor's dedicated MIR and NIR systems.

• Instrument shall offer an integrated methane gas cell to ensure high instrument-to-instrument stability and line-shape calibration technology.

• The System shall be a sealed and desiccated optical unit covering the range 14,700 – 350 cm-1.

• The system shall incorporate a vibration isolated baseplate

• The system shall incorporate kinematically mounted, zero alignment optics.

Kinematic in this context means that the component mounts precisely and unambiguously with zero play in its location. Pinned-in-place optics are not as precise and may have free play in the location and are more susceptible to thermal effects and are therefore not acceptable.

• The mid -IR source shall be pre-aligned and incorporate electronic stabilization.

Stabilization shall change the polarity through the source frequently to give the system higher sensitivity and increased performance.

o Without stabilization, the hot-spot can move out of the field of view of the optical system. Although the source is still apparently working, the energy seen by the detector drops radically. Changes in the energy uniformity will cause the instrument’s wavenumber scale to drift and the source to require replacement prematurely.

o The source shall be user replaceable to help maintain a lower cost of ownership.

• The system shall include a pre-aligned tungsten-halogen NIR source

• The system shall include an automated NIR and MIR source switching assembly.

• The system shall include a continuously variable J-stop that is fully software controlled.

o The variable J-stop provides the highest measurement accuracy and optimal throughput at intermediate resolutions, not just vendor determined resolutions.

• The system shall include a 7-position automated optical filter wheel containing traceable validation materials to allow instrument performance verification in both the Mid and Near-IR spectral regions.

• The system shall include a multi-layer potassium bromide beamsplitter for the Mid- IR spectral region and a wide-range multi-layer calcium fluoride beamsplitter for the NIR spectral region

• The system shall utilize high reflectivity, gold coated reflecting optics incorporating low angle off-axis design for optimal throughput.

• The system shall include two Temperature Stabilized, fast-recovery DTGS detectors;

one optimised for MIR and one optimized for NIR.

• The system shall be configurable for other detector options including a liquid nitrogen cooled MCT.

• The system shall include external windows sample windows.

o External windows allowing fast changeover for optimal spectral performance without having to open the spectrometer cover and contaminate the entire system with atmospheric vapour.

• The system shall include a desiccated storage area that allows storage of up to four optical windows.

o The desiccated storage area should be external and will not allow access to the beamsplitters or internal optics as this can cause unwanted changes in the internal atmospheric conditions on the instrument.

• The system shall include a humidity indicator.

• The system shall include the option to add fast scanning for time resolved measurements, with the ability to collect spectra at >90 scans/second

• The base system shall not have a weight higher than 100 lbs and must not have a depth or width larger than 25 inches in order to fit in with existing laboratory footprint.

A. System Performance

• The vendor shall demonstrate a Signal to Noise of better than 50,000:1 RMS under the following conditions:

o 2200 cm-1 to 2000 cm-1 o 4 cm-1 spectral resolution o 5 second background and sample acquisition times

• The vendor shall also demonstrate a Signal to Noise of better than a 174,000:1 RMS for a 1-minute data acquisition time (all other conditions the same as above)

• For Near-IR performance, the vendor shall demonstrate better than 10 x 10-6 Abs RMS in a 250 nm spectral range, around 1600 nm for a 1-minute scan

• The vendor shall demonstrate wavenumber precision of 0.008 cm-1 at 2,000 cm-1

• The vendor shall demonstrate wavenumber accuracy of 0.02 cm-1 at 2,000 cm-1

B. Accessories and Upgradability

• The system shall offer a large sample area providing plug-and-go capabilities for a wide range of MIR and NIR sampling accessories

• The system shall be configurable for a two sampling positions – one for NIR diffuse reflectance measurements in addition to the central sampling compartment

• The system shall be compatible with commercially available Mid and Near-IR sampling accessories from both the instrument manufacturer and third-party vendors.

o A large range of sampling accessories provides the flexibility to measure almost any solid, liquid, powder or paste across both MIR/NIR spectral ranges.

o The ability to use a wide variety of accessories either from the instrument manufacturer or a third-party accessory vendor will provide maximum flexibility of the system while still offering the flexibility to shop around for additional accessories.

• The system shall offer accessory options including a Diamond/ZnSe ATR crystal and a (externally mounted) Near Infrared Reflectance Accessory.

o A large range of sampling accessories provides the flexibility to measure almost any solid, liquid, powder or paste across the whole NIR/MIR range.

• The UATR must be of sufficient intelligence as to become a truly integrated part of the instrument once installed. Accessory intelligence must encompass at least the following four points:

1. Automatic recognition - as soon as the accessory is placed in the sample compartment the accessory is recognized. In addition to recognizing the accessory, the software must also:

• Record the accessory serial number

• Type of ATR crystal (1, 3 or 9 Reflection)

• System suitability checks carried out.

2. Automatic optimization - the optics are automatically and independently optimized for different top-plate options.

3. Once locked into the sample compartment, the accessory must be ready to be used without any manual alignment necessary.

4. Supplied pressure sensor must record the amount of pressure applied to the sample and store this information as part of the data file.

• The system shall include a NIR reflectance accessory as an intelligent sampling system for reflectance measurements of solids and transflectance measurements of liquids. The NIR reflectance accessory should incorporate the following 9 aspects:

1. Offer sampling options for a wide variety of sample types in various containers.

2. Incorporate an integrated, zero alignment, and zero set-up design. Once locked into the sample compartment the accessory becomes an integral part of the system and is ready to use.

3. Be self-referencing for increased reproducibility and ease of use.

4. Be in a horizontal sample platform for convenient sample positioning.

5. Offer a wide collection angle and large spot size the most representative sampling.

6. Incorporate an integrated, high-performance stabilized InGaAs detector system standard.

7. Supplied with standard accessories kit including sample positioner, reference materials, and sample handling tools.

8. Offer a range of optional accessories available for inhomogeneous solids or liquids samples including but not limited to:

Sample cup spinner that:

Fits directly on to the Near-Infrared reflectance accessory.

Auto-starts on scan start and auto-stops upon scan completion.

Includes 100mm diameter glass sample dishes.

• Transflectance adapters

9. Be easily removed and replaced in seconds via quick-release lever with automatic parameter setup or permanently incorporated into the spectrometer by mounting directly on the external beam port of the spectrometer.

Accessories mounted in an external module are not acceptable due to the extreme size (as compared to the Near-Infrared reflectance accessory) and additional validation required on the external module's detector(s).

• The system shall offer optional NIR accessories - must be modular, expandable and intelligent for simple accessory changeover with, full plug -n-play operation.

o Transmission Accessory with cuvette holder o Heatable transmission accessory with disposable vial or transmission cell compatibility for NIR or MIR o Tablet and powder autosampler for transmission and reflectance measurements

· Shall use twin InGaAs detectors

· Includes a 30-position sampling wheel

· Has interchangeable sample wheels

· Offers custom sample molds to eliminate stray-light

· Can be used with powder vial holders o NIR transmission fiber optic probes incorporating the following:

· Automatic recognition of the fiber optic sampling interface within Spectrum software.

· Electrically safe for use in hazardous environments. No electrical connections.

· Large optical depth of field for improved measurement of samples through thicker containers.

· 6 mm spot size for improved performance inhomogeneous materials.

· Probe tip features sapphire window for robustness and ease of cleaning.

o NIR reflectance fiber optic probes incorporating the following:

· The reflectance probe must be ATEX compliant to ensure safety.

· Automatic recognition of the fiber optic sampling interface within Spectrum software.

· Handset user interface and LCD display allowing continuous remote operation.

· Electrically safe for use in hazardous environments. No electrical connections.

· Large optical depth of field for improved measurement of samples through thicker containers.

· 6 mm spot size for improved performance with granular and inhomogeneous materials.

· Protective cap and probe holster with Spectralon reference for background collection.

· Probe tip features sapphire window for robustness and ease of cleaning.

3. Place of Performance

NASA Langley Research Center ATTN: Building 1146 Hampton, VA 23185

4. Period of Performance

30 days ARO.

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