SIGMA Replacement - Item Description.pdf
PDF 128 KB Posted
- Attached to
- Sigma SEM
- Solicitation number
- FA812626Q0037
About this file
This is a Memorandum for Record documenting equipment specifications for a Carl Zeiss Field Emission Scanning Electron Microscope (FE-SEM) replacement being procured by the 76 MXSG at Tinker Air Force Base, Oklahoma. The document was prepared on 20 January 2026 and outlines the detailed technical requirements and associated components for the acquisition.
The primary equipment is a GeminiSEM 460 FE-SEM configured with 40nA maximum resolution capability, accompanied by multiple analytical detectors including in-lens SE and EsB detectors, back scatter detector, and EBSD system with CMOS FSD technology. Supporting hardware includes two 34-inch ultra-widescreen LCD monitors, an enhanced SEM workstation PC with high computing specifications, a large PC table (1650mm x 1000mm), two CCD/navigation cameras, water chiller, plasma cleaner with license, active vibration isolation, UPS, and buffer pre-vacuum quiet mode. The analytical package features OXFORD Analytics components including AZtecLive Advanced with Ultim Infinity 100 EDS detector, BEX detector, and AztecCrystal MapSweeper with strain analysis capabilities. Software deliverables include Carl Zeiss SmartSEM with perpetual license (no subscriptions), Zen Core, Aztec modules, and Microsoft Office. The vendor is responsible for on-site installation, verification, and training for up to 10 people, plus two days of FE-SEM training and three days of Oxford advanced training. A 2-year on-site parts and labor warranty is required effective upon government acceptance, with government inspection mandated after installation and vendor responsibility for all deficiencies until acceptance.
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Other files
| File | Type | Posted |
|---|---|---|
| FA812626P0037.pdf | ||
| WageDeterminationRev29 2015-5315.pdf | ||
| FA812626P0037.pdf | ||
| Statement of Work_SigmaSEM.pdf |
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Text version
20 January 2026
MEMORANDUM FOR RECORD
SUBJECT: Item Description, Carl Zeiss FE-SEM replacement
1. The 76 MXSG is requesting utilization of funds for the purchase of a Carl Zeiss FE-SEM
2. The requested equipment item descriptions/specifications are outlined below.
One (1) Carl Zeiss Field Emission Scanning Electron Microscope and associated detectors for alloy analysis, fractography, and includes the latest manufacturer designs and analytical detectors.
• Specifications/Items:
• GeminiSEM 460 FE-SEM
• Carl Zeiss Software and Perpetual License for SmartSEM (No Subscriptions)
• In-lens SE detector and in-lens EsB detector
• 2x 34” Ultra widescreen LCD Monitors and Monitor holder
• Control Panel with rotary controls/keyboard (US English)
• 40nA Maximum resolution configuration
• SEM Workstation (PC) (enhanced with higher computing power: Storage, RAM, CPU, etc)
• Large PC Table (1650mm x 1000mm)
• Back Scatter Detector
• Plasma Cleaner (and associated license)
• 2x CCD/Navigation Cameras
• Support frame for 2nd PC
• Water Chiller
• Buffer pre-vacuum quiet mode
• UPS
• Active Vibration Isolation
• FE-SEM two day onsite training
• XB550L Chamber on a GeminiSEMX60
• OXFORD Analytics
• AZtecLive Adv with Ultim Infinity 100
• Ultim Max Infinity Large Area Analytical Silicon Drift EDS Detector
• BEX detector
• EBSD (CMOS FSD with 5 diodes, Symmetry S3, and integrated AZtecHKL Adv)
• AztecCrystal MapSweeper and Strain Analysis
• HP I9 PC w/ Microsoft Office License
• 2x 27” Monitors
• Oxford installation of EDS (2), BEX, and EBSD
• Oxford advanced training (3 days)
• Software: SmartSEM and Zen Core, Aztec and associated modules, Microsoft Office
• Warranty: 2-year on-site parts and labor warranty, effective upon government acceptance.
• Installation/Training: Vendor(s) provide on-site installation, verification, and training (up to 10 people).
• Quality Conformance: Government inspection required after installation. Vendor responsible for deficiencies until government acceptance.
File details come from the government source that posted it. Updated .