Attachment (A) Statement of Work.pdf
PDF 69 KB Posted
- Attached to
- ANT Zone Plates and Spatial Resolution Standards
- Solicitation number
- RFQ_463091
- Issued by
-
Department of Energy Office of Science
About this file
This document is a Scope of Work (SOW) from Brookhaven National Laboratory for the procurement of ANT Zone Plates and Spatial Resolution Standards. The vendor is required to provide high-quality zone plates and standards for use at four specific NSLS beamlines (HXN 3-ID, FIX 18-ID, SXN 29-ID-1, and CSX). Key requirements include fabrication according to specified specifications, separate packaging by destination beamline, and shipping with a detailed delivery report containing scanning electron microscope (SEM) images to verify lithographic critical dimensions and tolerances.
The SOW specifies that delivered items must arrive free of defects and damage, with a guarantee to meet quoted technical specifications. The vendor must provide height mapping data where possible and agrees to potential replacement or exchange of items within 12 months after delivery. The procurement is controlled under U.S. Department of Commerce Export Administration Regulations (EAR99 Technology), and the document is signed by a technical representative on 5-13-25, indicating the date of the SOW's preparation or approval.
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Text version
P.O. Box 5000 Upton, NY 11973-5000 t � Brookhaven- � National Laboratory managed by Brookhaven Science Associates for the U.S. Department of Energy
Subject: Scope of Work (SOW) for Delivery of ANT Zone Plates and Spatial Resolution Standards
Vendor will provide Brookhaven National Laboratory with high quality zone plates and spatial resolution standards that will be used at 4 NSLS beamlines (HXN 3-ID, FIX 18-ID, SXN 29-ID-1, and
CSX). The items should meet the following requirements:
• Items will be fabricated according to the Specifications.
• Items will be packaged separately according to destination beamline.
• The items will be shipped with a delivery report that includes scanning electron microscope (SEM) images to qualify and verify lithographic critical dimensions and tolerances. Height mapping data will be included where it is possible to verify feature thickness.
• Items to arrive at BNL free of defect and damage. The items will be guaranteed to meet quoted and agreed technical specifications and may be replaced or exchanged within 12 months after delivery.
This information is controlled by the U.S. Department of Commerce Export A dministration Regulations
15 CFR Parts 730-774 as EAR99 Technology.
I) -) ,- ./JSignature: I """---" � OfRequestor or Technical Rep
File details come from the government source that posted it. Updated .