AttachH-SolutionTestingStandards.docx

Attachment H: Description of Solution Testing Standards

The following section describes the testing that will be conducted by Independent labs, DoS and DHS.

1. Card durability, security, privacy feature testing

DoS Testing Card durability, security, privacy feature testing will be coordinated by CA/PPT as described below.

(ISO unless other) Standard (ISO unless other) Card Acceptance Criteria

ICC

reader equivalent

CARD STOCK

Personalization

Test for bubbling (out-gassing) and excessive or insufficient carbonizing.

RF sensitivity

ISO/IEC 18000-63

CBP 2600006-EDL-TP v3.2 dtd October 28, 2015 CBP 2600006-EDL-TP v3.2 dtd October 28, 2015.

Printer and RFID reader assessments will be conducted by a CA team to be determined.

2. Personalization Printer/RFID Testing

DHS Testing The following sections detail the methodology that will be used in each of the two product testing stages.

Lab Product Test This section describes the testing strategy that will be used in testing the Offerors’ cards in a lab environment.

Assumptions The following assumptions pertain to the test cases that will be executed in a controlled lab:

a. Only cards of Offerors which have passed the functional, physical and security testing will be tested during this stage.

b. At least one hundred (100) cards per Offeror will be available.

c. The industry-standard RFID test suite installed at a DHS Customs and Border Protection (CBP) facility.

d. The Offerors have provided a spreadsheet to include the RFID number, TID and Document number of each card.

e. Cards are personalized with sample data in the DoS IV&V lab.

Test Strategy – Lab Card Performance Evaluation The Offerors will be evaluated based on the performance of their fully personalized Passport Cards in a lab environment. Government representatives will test each card in this environment by executing every predefined test case. A test case may be executed multiple times with the same card. Each time a test case is executed, the results will be recorded along with any additional information, comments or questions. Product testing will be performed for the following:

a. Orientation sensitivity – Five cards from each Offeror will be measured at orientation steps of 10 degrees in elevation and separately in azimuth at three frequencies (902MHz, 915 MHz and 928 MHz)

b. Maximum RF sensitivity – 100 cards from each Offeror will be measured to determine the Power on Tag (PoT) needed to communicate with the card at 1 MHz steps from 902 MHZ through 928MHz.

c. Card RF reflectivity – The signal level of the card response for 100 cards from each Offeror will be determined at 1 MHz steps from 902 MHz through 928 MHz.

d. Privacy access for attenuating sleeve - The tester will evaluate card performance when attempting to read a card encased in its attenuating sleeve (e.g., when the card is placed in the attenuating sleeve, the card should not be readable).

e. RFID encoding – The tester will evaluate each card for RFID encoding and security in accordance with the requirements stated the below Sections: RFID Encoding and RFID Security.

f. MRZ readability – For each of the100 cards from each Offeror, the tester will evaluate card performance when the MRZ of the card is scanned to ensure MRZ readability is not impacted.

RFID Encoding

1. Each Offeror’s card will contain a Gen 2 RFID chip with 96 bits of EPC memory encoded by the Offerer in the GDTI-96 format and 64 bits of uniquely serialized, factory programmed tag identification (TID) memory.

2. The tester will read the encoded GDTI-96 RFID number on each card to compare data provided on the spreadsheet completed by the Offerors (RFID and TID numbers). The tester will perform the following on each of the Offeror’s cards:

a. Ensure the scanned 96-bit EPC numbers match the numbers in the spreadsheet.

b. Ensure the scanned unique TIDs match the numbers in the spreadsheet.

RFID Security

1. After verifying the EPC is correctly encoded and has the expected value, the tester will run the following tests on each Offeror’s card:

a. Attempt to write a new EPC value to the tag. This test should always fail if the card is correctly permalocked. Examine the EPC memory bank and ensure that unused bits of the bank are set to zero.

b. Attempt to unlock the User memory bank and write a new value to that memory. This test should fail is the card is correctly permalocked. Examine the entire User memory bank and ensure it is set to all zeros.

c. Attempt to kill one of the cards using the appropriate command from the RFID reader. This test should always fail.

d. Attempt to change the kill password and then kill one of the cards using the appropriate command from the RFID reader. This test should fail: the kill password should be locked and immutable.

e. Compare the TID values among all of the cards provided by the Offerer. The numbers should be unique for each card.

2. Upon completion of all tests cases for all selected Offerors, the results of the testing will be documented and analyzed. If tests of an Offeror’s card have resulted in any questions or defects specifically a defect that indicated the proposed solution would not meet the governments’ requirements over the course of the contract, the questions and defects will be detailed and given to the Offeror. At the discretion of the government, Offerors may be given predefined limited number of days in which to prepare responses to the questions and defects. Responses from an Offeror could result in additional tests of the Offeror’s cards, at the discretion of the government. If an Offeror chooses not to reply to questions/ defects that resulted from the product testing, the Offeror’s proposal may be deemed non-responsive or may otherwise affect the assignment of evaluation points.

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