A1-drawing1-DSG-000109878.pdf
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- Solicitation number
- Req-367276
- Issued by
-
Department of Energy Office of Science
About this file
This is a technical engineering drawing specification for a silica single crystal component used in X-ray diffraction applications at SLAC National Accelerator Laboratory.
The drawing specifies a silicon crystal with (220) crystalline orientation intended for use in LCLS (Linac Coherent Light Source) and S&D (Supplier & Development) applications. Key dimensional specifications include a primary diffraction surface measuring 30.00 mm × 22.50 mm with a tapered edge profile, secondary dimensions of 7.50 mm and 5.00 mm, and an 85-degree angled corner. Critical quality requirements mandate RMS surface roughness of 5 nm or better and RMS flatness of 100 nm or better on the polished diffraction surfaces (A and B), with all surfaces etched to remove induced strain from machining. Tolerance specifications follow ASME Y14.5 standards, with dimensional tolerances of ±0.02 mm for two-decimal dimensions and ±0.005 mm for three-decimal dimensions, plus ±0.1 degree for angular measurements. Crystal orientation accuracy must be maintained at ±0.02 degrees or better for the W axis and ±0.05 degrees or better for the Y axis. The estimated mass is 0.007 kg. The specification is designated as DSG-000109878 and is maintained under SLAC's format V3.4 with internal corner radii not to exceed 0.4 mm. Surface C is specified as "good as cut," while surfaces near the diffraction edges must be polished to the edge and remain free of machine damage.
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Text version
REV
APPROVALS
D
B
C
D
78 1
ENGR
DWN
CHKR
DATE
A
SCALE:
B
A
O F
S
HD
DWG TYPE:
DESCRIPTION DWN CHKR APVDDATE
D
C
DRAWING NUMBER REVISION NUMBER
DO NOT SCALE DRAWING
THE DRAWINGS, SPECIFICATIONS AND OTHER DATA HEREIN PROVIDED SHALL
NOT BE COPIED, PUBLISHED OR OTHERWISE FURTHER DISSEMINATED WITHOUT
PRIOR WRITTEN PERMISSION OF STANFORD UNIVERSITY/SLAC
SLAC FORMAT V3.4
BREAK EDGES 0.13 - 0.4
UNLESS OTHERWISE SPECIFIED DIMENSIONS ARE IN MILLIMETERS
INTERNAL CORNERS R 0.4 MAX
TOLERANCES:
ALL SURFANGLE ±
ASME Y14.5-LATEST VERSION
DIMENSIONING AND TOLERANCING IS IAW
NEXT ASSEMBLIES:
GENERAL TOLERANCES ± 0.1 ± 0.2 ± 0.3 ± 0.5 ± 0.8 ± 1.2 ± 2
DIMENSIONS < 6 > 6 > 30 > 120 > 315 > 1000 > 2000
ESTIMATED MASS:
CAD FILE NAME:
85.0°
10.50 12.00
5.00 6.50
22.00
0.8
7.50
22.50
B B
A
C
DIFFRACTION SURFACE
INSCRIBE HERE OR THE OTHER SIDE
CRYSTAL ORIENTATION
5.00
30.00
DIFFRACTION NEAR THESE TWO EDGES
SURFACE POLISHED TO THE EDGE
NOTES: UNLESS OTHERWISE SPECIFIED
1. UNITS: mm, DEG
2. TOLERANCE:.XX+/- 0.02mm, ,XXX +/-0.005m, ANGLE: +/- 0.1 DEGREE OR BETTER
3. CRYSTAL ORIENTATION: Si (220)'
4. CRYSTAL MUST BE FREE OF STRAIN AFTER POLISHING/ ETCHING
5. ALL SURFACES MUST BE FREE OF MACHINE DAMAGE. ALL SURFACES ETCHED
TO REMOVE ANY INDUCED STRAIN.
6. SPECIFICATION OF ROUGHNESS/ FLATNESS OF DIFFRACTION SURFACES A AND B:
RMS SURFACE ROUGHNESS 5nm OR BETTER RMS FLATNESS 100 nm OR BETTER
7. SURFACE C GOOD AS CUT
8. ORIENTATION ACCURACY WRT CRYSTALLINE AXIS:
=/- 0.02 DEGREES OR BETTER FOR W AXIS
+/- 0/05 DEGREES OR BETTER FOR Y AXIS
SEE LAST PAGE FOR DEFINITION OF X/Y AXIS
SILICA SINGLE CRYSTAL
STOCK NO MATERIAL DESCRIPTION
DSG-000109881
5:1 0.007 kg
Y SUN
RH PAUL 20260814
Y SUN
Y SUN
PART
LCLS XPP
LCLS XPP
S&D COMM CRYSTAL
DSG-000109878 00
DSG-00010987800
DSG-000109878.dft
1---
Sun, Yanwen D
Sun, Yanwen
File details come from the government source that posted it. Updated .