Addendum and Acknowledgement Doc 2.doc

Office of the Chief Financial Officer

Procurement Department

Argonne National Laboratory

9700 South Cass Avenue, Bldg. 201

Lemont, IL 60439

1/12/2026

TO ALL OFFERORS:

Subject:

Request for 6-S176-Q-00092-00 No.

Addendum No. 002 Attached herewith for your information and use in preparing your proposal for subject project is Addendum No. 002.

Kindly acknowledge receipt of this Addendum by signing and returning a copy of this letter via email.

Sincerely, Procurement Department

Receipt Acknowledged:

Company:

By:

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Addendum No.

TO

REQUEST FOR 6-S176-Q-00092-00

FOR

Argonne National Laboratory

BLDG. 201 OCF

9700 S. Cass Ave.

Lemont, IL 60439

1/12/2026 This addendum is being issued to modify the subject REQUEST FOR Quotation (RFQ) 6-S176-Q-00092-00 as follows:

Offer Deadline will be extended to January 16, 2026.

Responses to the below questions and clarifications within the SOW:

The XRF unit is an in-line unit that will be incorporated to a roll-to-roll coating machine. It must have enclosure to comply with radiation safety requirement. The handheld unit is not applicable.

1. Questions on Samples to be Analyzed

a. Samples for thickness and/or composition analysis?

i. Which elements & what thickness ranges for layers to be measured?

The XRF will be utilized for research purposes. A wide range of materials could be characterized and thus the elements could be from Na all the way to Ho. For the same reason, the film thickness is between several tens of nanometers to a few hundred micrometers.

ii. What is the substrate material & thickness?

Both polymer and metal substrates will be used depending on the need. Examples include PTFE, Nylon, Polyethersulphone, paper, aluminum and copper foil, etc. The thickness of the substrates is in the range of 10-500 µm.

iii. Is there a specification for detection limits & repeatability for measurements?

Yes. Standard deviation is expected to be less than 3% for measurement time (speed) less than 1 second.

iv. For contaminates, which elements & detection limits? Any spec you would like to conform to here (ex: RoHS)

The only contaminant element we are concerned about at this stage is Fe, with the detection limit in ppb level. No internal standard to be evaluated against.

v. Sample dimensions?

Maximum web width is 320 mm.

vi. Sample Geometry (flat?)

Most samples are flat, in the format of film.

vii. Desired measurement location?

We would like to compare center and edge composition of our films/membranes. Thus, it would be ideal if the position of the XRF head can be adjusted to measure locations within a distance of 160-320 mm.

viii. Any desired measurement features (location on pattern, or is this a uniform film with no features)?

Please refer to the above.

Basic requirements for this in-line system include:

1. In-Line Monitoring XRF Module:

· Measurement speed: ≥10 ms

· Do you need discreet point measurements or an average over an area of the sample?

An average over an area of about 1 mm2 is acceptable.

· A broad target element range between Al and U

· Irradiation area ≥100 mm

· Is this due to sample geometry, or is a smaller spot size with high signal acceptable?

Smaller spot size with high signal is acceptable.

· Working Distance ≥100mm

· A 100mm+ working distance with 10W is concerning for total flux back to detector to ensure an accurate & precise measurement. Is this a requirement due to sample geometry or how the sample is presented to the system? While 100mm is possible, a closer working distance will yield better results.

Closer working distance is acceptable. Sample (film + substrate) thickness is within a few mm.

2. Tool comes with software to enable:

· Orchestrator

· Can you clarify, what is Orchestrator?

We meant that the tool could export data real time. However, if the vendor allows us to access tool PLC or data interface with communication protocols (e.g., API), we can extract data using our own Python codes.

· Recipe configuration and adjustment

· The software

· Can you clarify?

This

Other Software Questions

a. Which software do you require the system to interface with?

b. Any specific file types or format needed for output?

c. Any specific requirements for data management / report generation?

This is a broken sentence by mistake. Please ignore this requirement.

3. External data communication

· Tool comes with communication protocols and data interface to allow near real-time data collection

· Measurement results can be automatically compiled and exported in standard CSV or TXT file formats, enabling effortless integration with your Quality Management System (QMS) or Statistical Process Control (SPC) software. System can also enable direct remote control and integration with factory automation networks via a Network Protocol.

This meets our requirements. We would like to build machine learning enabled autonomous processes, which requests real-time data collection and analysis by our ML algorithm.

4. Safety compliance

· The equipment needs to have an x-ray shielding enclosure, which can be mounted to customer’s roll-to-roll coating machine.

· How does system need to mount to roll to roll machine

If possible, we would like to have the web (sample) passing through the XRF chamber without causing radiation leakage.

· Is there a space already dedicated for the system, if so what are its dimensions & total allowable footprint

The footprint is about 0.5 x 0.5 m2. No limitation in height.

· Dimensions of and location for sample pickup & handoff

Sample is a moving web. It will pass through the XRF unit and will be winded to a roll.

· Does the system need to pick up / introduce the samples to the system for measurement or are samples already moving in a manner that can be presented to the system?

· The samples will be transferred to the XRF through web movement. Sample pickup function is not required.

· If system is to manipulate sample introduction to measurement, is sample loading to the overall system to be manual, or is there another automated process we must interface with?

The system will not manipulate sample introduction. Please refer to the above.

· Any special sample handling requirements?

No special sample handling is required. As long as the XRF unit does not interfere with web movement (~10 to 40 m/min), it should be good.

· If at all possible, an overview of your process would be desired to ensure the operation is as seamless & automated as possible.

Yes. We can provide additional processing information if your equipment meets our Procurement requirements.

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