RFQ questions.docx
DOCX document 16 KB Posted
- Attached to
- X-Ray Computed Tomography (XCT) System Federal contract opportunity
- Solicitation number
- 1333ND21QNB680016
About this file
This document contains questions and answers regarding a solicitation for an X-Ray Computed Tomography System. The National Institute of Standards and Technology requires a system with hardware and software flexibility for research purposes including developing error models to predict measurement results and providing low-volume calibration services. Acceptable features include dual anode configurations up to 225-240kV, and the ability to interface with a Deben CT500 load frame. The window view to the interior is required for the entire scan duration to enable laser interferometry. Up to 220V 60Hz single phase power will be provided. Artifacts will be provided to respondents for testing purposes depending on the evaluation phase. Customs fees must be included in pricing.
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Other files for this federal contract opportunity
| File | Type | Posted |
|---|---|---|
| Attachment II - Instructions to Offerors(Updated Dec 7).docx | DOCX document | |
| Attachment I - Specifications (Update Dec 7).docx | DOCX document | |
| Attachment V - Provisions and Clauses(Update Nov2).docx | DOCX document | |
| Attachment III - Evaluation Criteria (Dec 7).docx | DOCX document | |
| Attachment IV - Quotation Checklist(Updated Nov 9l).docx | DOCX document |
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Text version
(Reference 6A) - In lieu of panel-shifting techniques to effectively increase the size of the detector plane, can techniques such as offset and/or helical CT be implemented to increase the scanning volume?
Answer: No, we require panel-shifting techniques for this stronger consideration.
(Reference 8) - Will multiple tube anode configurations, which are designed as interchangeable be accepted?
Answer: Dual anode configuration is acceptable to meet Requirement 8b.
(Reference 11) - Can other methods of focal spot calculation be used (such as ASTM)?
Answer: Yes, provided the method is appropriate for the focal spot size.
[Forest, if necessary, we could reword requirement 11 (last line) for clarity: Spot size may be estimated as two (2) times the JIMA resolution or it may be estimated using another appropriate method. The offeror must state the method used to calculate spot size.]
(Reference 19) - Is there a specific temperature range requirement for the interior environment?
Answer: No, there is no specific temperature range requirement.
(Reference 21) - What is the desired number and size of the cable ports? Or, what sizes and quantities of cabling are anticipated?
Answer: If the system can handle the cabling for the Deben CT500 load frame, it will meet our needs for other cables.
(Reference 22) - Does the vendor need to supply a Deben CT5000 load frame? Are there any interfacing software requirements?
Answer: No, the vendor does not need to supply a Deben CT5000 load frame. We do not have any requirements for software interfacing to the Deben CT5000 load frame.
(Reference 23) - Can multiple real-time CCTV cameras be used in place of a window? Is the need to view the sample during the entire scan, or only during set up?
Answer: No, multiple real-time CCTV cameras cannot be used in place of a window. The window is necessary to enable the use of a laser interferometer for error-mapping while the x-ray source is on, so the view to the interior of the cabinet is needed during the entire scan.
(Reference 24) - Will 220VAC single phase be acceptable and available? Will vendors need to supply phase conversion hardware?
Answer: Yes, we can supply up to 220V 60 Hz single phase from a 60 amp junction box that can be directly wired to the XCT machine.
(Reference 39) - Is there a specific standard or range of sizes for the calibration/geometry artifacts to be supplied by vendors?
Answer: No, there is no specific standard or range of sizes for the calibration/geometry artifacts to be supplied by vendors.
(Reference 44) - What is the timeline for the artifact testing as part of the solicitation evaluation? Can additional information be provided on these artifacts?
Answer: The timeline for artifact testing will be somewhat dependent on the number of respondents that meet the subset of technical requirements that are evaluated as part of Phase I because we have a limited number of artifact sets that we can send to the respondents for testing. We are open to providing additional information on the artifacts, so long as it does not compromise our ability to obtain the data that we are seeking during the artifact testing phase (e.g., we will not share calibrated values or CAD drawings of the artifacts).
(Reference – General) The system states the possibility for a dual head x-ray source. Has NIST considered a dual head with up to 500kv in the same small-scale system?
Answer: We did consider tube voltages greater than 240 kV. The smaller spot size that comes with lower voltage tubes is crucial for both our additive manufacturing and dimensional metrology research and we are able to size our additive manufacturing samples and dimensional metrology artifacts such that 225 kV and 240 kV tubes meet our needs.
(Reference – Shipping) - Is NIST subject to U.S. Custom Duties we are under the impression that U.S. Govt. Agencies are exempt. Can you please confirm this?
Answer: The Government is not exempt from custom fees. As stated in section V, Attachment I of the solicitation, “Delivery shall be FOB Destination (or equivalent terms, such as INCOTERMS Delivered Duties Paid)…”. All customs fees, if applicable, must be included in the submitted quote
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