X-Ray Scattering System (2024-UWMSN-00349-RFB)

The University of Wisconsin-Madison is seeking bids for an X-Ray Scattering System through a competitive Request for Bid (RFB) process, solicitation number 2024-UWMSN-00349-RFB. The procurement is specifically for a sophisticated scientific instrument with detailed technical specifications, including a desired Q-range from 0.009 nm1 to 49 nm1, a high useful flux capability of at least 100 Mph/s at the sample, and a point microfocus sealed tube copper anode with 30 watts of power. Key system requirements include a motorized detector capable of traveling from 45 mm to 1.75 meters along the beam axis, a large vacuum chamber of at least 80 liters with dual-side access, and on-axis in-line sample vision with distortion-free imaging during automated distance changes. Interested vendors must submit their responses online through the SciQuest platform by July 31, 2023. All questions regarding the solicitation must be directed to Mike Marean via email at mike.marean@wisc.edu. The University will serve as the sole judge of research applicability for all specifications and will permit submission of alternate specifications for consideration.

The solicitation does not explicitly mention specific set-aside designations or restrictions on vendor participation. The procurement appears open to qualified vendors capable of meeting the complex technical specifications for the X-Ray Scattering System. While no specific budget range is disclosed in the available documentation, the complexity of the instrument suggests a potentially significant procurement value. The University demonstrates flexibility in evaluating alternate wattage, filtering methods, and instrument configurations that can meet the minimum and maximum Q-range requirements with adequate intensity and quality. Vendors should carefully review Amendment #1 to the RFB, which provides comprehensive details about the technical requirements and evaluation approach. Prospective bidders will need to demonstrate advanced scientific instrumentation capabilities and a thorough understanding of high-precision X-ray scattering system design and performance parameters.