X-Ray diffractometer
Closed Solicitation Posted
- Solicitation number
- LBLAM20250117
- Agency
-
Department of Energy
- Responses due
- Set-aside
- Total Small Business
Opportunity facts
- NAICS code
- 334517 Irradiation Apparatus Manufacturing
- Place of performance
- Berkeley, California 94720, United States
- Points of contact
Notice details come from SAM.gov. Updated .
About this opportunity
The Department of Energy is seeking to procure a high-performance X-Ray diffractometer for Lawrence Berkeley National Laboratory with specific technical requirements. The solicitation calls for a system with a high brightness Cu x-ray source and solid-state 2D area detector, capable of at least 5kW output with either a sealed or rotating anode. The required system must feature automated or user-interchangeable optics to enable multiple X-ray measurement types including Bragg-Brentano, Parallel beam, and Convergent spot-focused beam configurations. Vendors responding to this Request for Information (RFI) are expected to demonstrate core competencies, management capabilities, customer service processes, and quality assurance programs related to x-ray diffractometers. The response deadline is February 7, 2025, at 1:00 PM Pacific Time, with responses to be submitted via email to AMathias@lbl.gov. While this is currently an RFI, LBNL indicates a potential Request for Proposal (RFP) and award are planned for Spring FY 2025.
The solicitation is designated as a Total Small Business set-aside, meaning only small businesses can compete for this opportunity. The contract is located in Berkeley, California, with an estimated project value between $600,000 and $700,000. The procurement falls under NAICS category 334517 (Irradiation Apparatus Manufacturing) and PSC category 6625 (Electrical And Electronic Properties Measuring And Testing Instruments). While the solicitation seeks one X-Ray diffractometer, the specific procurement timeline suggests potential for future related purchases. The detailed technical specifications indicate this is a precision scientific instrument intended for advanced research purposes, likely supporting Lawrence Berkeley National Laboratory's sophisticated research and development initiatives. The RFI explicitly states that no contract will be directly awarded from this initial information request, signaling a structured procurement approach.
Notice text
1 - X-RAY diffractometer. The system must meet the following minimum technical requirements and capabilities.
1) High brightness Cu x-ray source and solid-state 2D area detector. 5kW or brighter, sealed or rotating anode.
2) Automated or user interchangeable optics to enable the following X-ray measurement types:
• Reflected beam optics: Bragg-Brentano, Parallel beam, Convergent spot-focused beam <500um.
• Transmission beam optics: focusing optics for high resolution measurements.
3) Integrated sample mounting and software integration to enable the following:
• High-throughput sample stage for min. 96 well-plate. Software/hardware automation for alignment/measurement.
• Horizontal sample mount for both high-throughput stage and single sample that has the ability to measure in both reflection and transmission mode.
• Heating stage with integrated temperature control and measurement from room temperature to 1000C or greater. Must be compatible with vacuum, ambient, inert and reactive gasses, to include hydrogen gas.
• Detection and guidance features to ensure proper optical path accessories are installed for the type of measurement being performed.
• Must have automated beam alignment.
4) Software requirements:
• Software must have a user-friendly interface, and the ability to save measurement presets and set user/administrator settings as this tool will be available as a non-specialist, multi-user capability.
• Software must enable external scripting (such as Python) for automating hardware sample positioning and measurement controls.
• Must include a comprehensive suite of data analysis capabilities, including: Rietveld refinement, texture analysis, whole pattern fitting, peak-fitting, thin-film reflectivity pattern analysis, and data visualization.
Files
| File | Type | Posted |
|---|---|---|
| RFI 1-24-25.docx | DOCX document |
Similar open opportunities
| Opportunity | Agency | Set-aside | Responses due |
|---|---|---|---|
| Micro Electron Diffractometer (MicroED) System | Department of Energy | No set-aside | |
| Beamline 4. 3. 1 Monochromator system | Department of Energy | No set-aside | |
| X-ray imaging detector system | Office of Science | No set-aside | |
| NOVO DR Inc. , Discovery III System 22WNH - Bright XL, and accessories | Department of Energy | No set-aside | |
| X-ray Diffraction Equipment Re-installation | Air Force Sustainment Center | No set-aside |
On GovTribe
Work this opportunity
- Track it in your pipeline
- Find teaming partners
- Similar opportunities
- Ask GovTribe AI about this opportunity