Secondary Ion Mass Spectrometer (SIMS) Analysis System

The Department of the Navy's Office of Naval Research (ONR) is seeking to procure a Secondary Ion Mass Spectrometer (SIMS) Analysis System for advanced semiconductor material analysis. The system must have sophisticated capabilities including dynamic and static SIMS measurement modes with high sensitivity, multiple ion gun primary beams, and the ability to analyze 100mm diameter wafers and 20mm thick samples. The procurement is a market research effort conducted through a Sources Sought Notice/Request for Information (RFI) to identify capable vendors in the Analytical Laboratory Instrument Manufacturing sector. Interested parties must submit 10-page capability statements addressing technical qualifications, commerciality, product descriptions, and past performance by February 20, 2025. Evaluation will focus on vendors' technical capabilities, commercial availability of the proposed SIMS system, and demonstrated experience with similar complex scientific instrumentation.

No specific set-aside designations are associated with this procurement, indicating it is open to all qualified vendors. The system will be used at Naval Research Laboratory facilities in Washington, D.C., with potential performance at both government and contractor locations. While no specific award value is disclosed, the technical complexity suggests a high-value procurement typical of advanced scientific instrumentation. The required system specifications indicate a need for comprehensive features including multiple ion beam capabilities, UHV main chamber, load lock system, sample heating, electron flood gun, and sophisticated control software. The procurement includes requirements for on-site installation, training, and a minimum 12-month warranty, suggesting a comprehensive and technically demanding acquisition process that will likely involve significant investment and detailed technical evaluation.