NOTICE OF INTENT TO SOLE SOURCE for Dual-Probe Micro-Feature Coordinate Measuring Machine (CMM)

Closed Special Notice Posted

This opportunity was awarded. See the award notice from .

Agency
National Institute of Standards and Technology Department of Commerce
Responses due
Set-aside
No set-aside

Opportunity facts

NAICS code
334516 Analytical Laboratory Instrument Manufacturing
PSC
6640 Laboratory Equipment And Supplies
Place of performance
Gaithersburg, Maryland 20899, United States

Notice details come from SAM.gov. Updated .

About this opportunity

This Special Notice from the National Institute of Standards and Technology announces their non-competitive intent to procure a dual-probe micro-feature coordinate measuring machine. NIST conducted market research from February to May 2023 to determine if any sources could meet their requirements, including surveying vendors, existing instruments, relevant publications, and issuing a sources sought notice, but only Mitutoyo America Corporation appears capable of meeting their needs.

The dual-probe CMM will replace outdated systems in NIST's Advanced Measurement Lab and enable them to continue and expand delivering reimbursable dimensional measurement services for features as small as 25 micrometers. Interested parties must respond by July 25 with their UEI number, details on meeting NIST's minimum requirements, evidence of product authorization, and any other information for NIST to determine competitive satisfaction of requirements. Responses will be considered solely to determine competitive procurement. Only Mitutoyo appears capable of meeting NIST's needs for touch and vision probes measuring features from 25 micrometers to several millimeters on 400mm plates and 200mm range.

Notice text

Notice of Intent to Noncompetitively Acquire a Dual-Probe Micro-Feature Coordinate Measuring Machine (CMM).

This notice is not a request for a quotation. A solicitation document will not be issued, and quotations will not be requested.

This acquisition is being conducted under the authority of FAR 13.106-1(b). The North American Industry Classification System (NAICS) code for this acquisition is 334516 – Analytical Laboratory Instrument Manufacturing, with a small business size standard of 1,000 employees.


The National Institute of Standards and Technology (NIST) Dimensional Metrology Group (DMG) intends to procure a dual-probe (touch probe and vision probe) micro-feature coordinate measuring machine (CMM) for installation into a high-accuracy temperature and humidity controlled laboratory in the NIST Advanced Measurement Lab (AML) in Gaithersburg, Maryland. It will replace a current outdated and unsupported dual-probe CMM (Mitutoyo UMAP Vision System Ultra QV350). With advances in the accuracy of vision systems over the last 15 plus years, our intent is for this same system to also replace a dedicated vision CMM (Nikon NEXIV Vision CMM), which is also no longer supported. Touch capabilities must cover features of size ranging from 25 um to several millimeters with as large as possible aspect ratios between the probe diameter and shaft length. Vison must be able to accurately measure pitch and features of size for grid plates and stage micrometers with line widths as small as 10 um. The machine volume must be such that it can accommodate 400 mm x 400 mm grid plates (measurement area may be less, but more is better), and a minimum of 200 mm range in Z to allow for multiply item access during a sequence of measurements and measurement item fixturing. This dual-probe micro CMM will enable NIST DMG to continue to provide and expand delivery of reimbursable dimensional measurement services for features of size ranging from 25 um to several millimeters that establishes traceability the SI-unit of length, the meter (m).

NIST conducted market research from February 2023 to May 2023 to determine what sources could meet NIST’s minimum requirements. This included surveying vendors through web searches, surveying existing NIST instruments, reviewing all relevant publications over the last 10 years to identify if there were any suppliers of commercially available instruments, using the Manufacturing Extension Partnership (MEP) supplier scouting service, and issuing a sources sought notice. The MEP conducted a nation-wide search for U.S. manufacturers capable of meeting the Government’s specifications. The opportunity “2023-022 Dual Probe Micro CMM” was posted to the MEP National Network from February 15, 2023, to March 15, 2023. MEP Center Staff reviewed the opportunity and consulted with small and medium manufacturers, returning two matches for the requirement under this acquisition. However, both did not offer probes as small as the size (diameter) required to measure the target feature size. Additionally, Sources Sought Notice AMD-SS23-06 was posted to SAM.gov from February 22, 2023, through March 8, 2023, with no responses received. The results of market research revealed that only Mitutoyo America Corporation (UEI: DWD6M3KJUGB7) appears to be capable of meeting NIST’s requirements.

However, any sources that believe they are capable of meeting NIST’s minimum requirements are encouraged to respond to this notice by the response date to provide the following information at a minimum: Company Unique Entity Identifier (UEI) number in https://sam.gov; details about what your company is capable of providing that meets or exceeds NIST’s minimum requirements; whether your company is an authorized reseller of the product or service being cited and evidence of such authorization; and any other information that can help NIST determine whether this requirement may be competitively satisfied. 

A determination by the Government not to compete the proposed acquisition based upon responses to this notice is solely within the discretion of the Government. Information received will be considered solely for the purpose of determining whether to conduct a competitive procurement. Only responses received by the offers due date and time of this notice will be considered by the government. Responses shall be submitted via email to nina.lin@nist.gov

Notice history

Notices posted for this opportunity, newest first
Notice Type Posted
Award Notice for Dual-Probe Micro-Feature Coordinate Measuring Machine (CMM) Award Award Notice
NOTICE OF INTENT TO SOLE SOURCE for Dual-Probe Micro-Feature Coordinate Measuring Machine (CMM) This notice · Latest special notice Special Notice
Dual-Probe Micro- Coordinate Measuring Machine (CMM) Original Pre-Solicitation

On GovTribe

Work this opportunity on GovTribe

  • Track it in your pipeline
  • Find teaming partners
  • Similar opportunities
  • Ask GovTribe AI about this opportunity