Maintenance for FEI Helios 600i Focused Ion Beam / Scanning Electron Microscope for Benet Labs, Watervliet, NY

Closed Solicitation Posted

Solicitation number
W911PT21Q0066
Agency
Responses due
Set-aside
No set-aside

Opportunity facts

NAICS code
811219 Other Electronic and Precision Equipment Repair and Maintenance
PSC
J036 Maint/Repair/Rebuild Of Equipment- Special Industry Machinery

Notice details come from SAM.gov. Updated .

Notice text

To cover the cost of Focused Ion Beam/SEM Maintenance per Scope of Work for a base and an option year.

Service Contract Labor Standards 15-4143 Rev 17 apply and are incorporated.

Note: Procurement is sole source with FEI, Hillsboro, OR. All responsible offerors may submit a quote which will be evaluated.

Files

File Type Posted
W911PT21Q0066.pdf PDF
15-4143 Rev 17.pdf PDF

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