Helios 600i Focused Ion Beam Scanning Electron Microscope Annual Maintenance for Watervliet Arsenal, NY

Closed Solicitation Posted

Solicitation number
W911PT26QA041
Agency
Responses due
Set-aside
No set-aside

Opportunity facts

Place of performance
Watervliet, New York 12189, United States

Notice details come from SAM.gov. Updated .

About this opportunity

The Department of the Army Materiel Command Contracting Command Detroit Arsenal is seeking annual maintenance, support, repair, and software updates for a FEI Helios 600i Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) Dual Beam system at Benet Laboratories. This is a firm fixed-price commercial services contract under NAICS code 811210 for electronic and precision equipment repair and maintenance. Key contract requirements include providing one preventive maintenance visit annually, calibration to factory specifications, original equipment manufacturer replacement parts, labor, materials, repairs, software updates, and telephone support during business hours (Monday-Friday, 8:00 AM-5:00 PM EST). The contractor must respond to service calls within 48 hours of equipment problem notification and maintain a 98% acceptable quality level. Offers are due by March 6, 2026, at 3:00 PM EST, with the contract specialist Katja Fox available at 518-266-5757 or katja.fox.civ@army.mil for inquiries.

This is a sole source procurement with FEI Company, though all responsible offerors will be considered. The solicitation includes a women-owned small business (WOSB) designation consideration, and the Service Contract Labor Standard Wage Determination 2015-4143 applies to the work. The contract covers one year of maintenance services from April 1, 2026, through March 31, 2027, with the contractor required to supply specific consumable items including an ion source, extractor assembly, and suppressor assembly. The place of performance is Watervliet Arsenal, New York. No specific award value or budget range is disclosed in the solicitation notice.

Notice text

This solicitation is for the procurement of 1 LOT - Annual maintenance, support, repair and software updates to FEI Helios 600i Focused Ion Beam, (FIB) / Scanning Electron Microscope (SEM) Dual Beam per the attached Performance Work Statement (PWS) for Benet Laboratories. Wage Determination No.2015-4143 latest revision applies and is attached.

*** This is a Sole Source Procurement with FEI Company. All Responsible offerors will be considered. ***

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