CHIPS XAFS and Diffraction, Silicon Drift Detector

Awarded Award Notice Posted

Solicitation number
1333ND24PNB030428
Agency
National Institute of Standards and Technology Department of Commerce
Awarded
to Dectris USA Inc.
Set-aside
No set-aside

Opportunity facts

Contract number
1333ND24PNB030428 Federal contract award
NAICS code
334413 Semiconductor and Related Device Manufacturing
PSC
6640 Laboratory Equipment And Supplies
Place of performance
Upton, New York 11973, United States
Points of contact

Notice details come from SAM.gov. Updated .

About this opportunity

The National Institute of Standards and Technology (NIST), under the Department of Commerce, awarded a sole source contract to DECTRIS USA INC on September 3, 2024, valued at $798,300 for the procurement of two specialized X-ray detectors for the Beamline for Materials Measurement facility at Brookhaven National Laboratory. The contract includes a high-resolution strip detector and a large-area, photo-counting X-ray detector designed to support advanced X-ray diffraction and semiconductor device characterization, with technical specifications requiring photon-counting capabilities across six decades of dynamic range and energy discrimination ranges of 4.5-40 keV for the strip detector and 3.5-30 keV for the large-area detector. NIST conducted extensive market research from August 2023 through May 2024 and determined that DECTRIS AG was the sole source capable of meeting the specialized technical requirements, ultimately awarding the contract under noncompetitive procurement authority to enhance measurement capabilities for collaborative research with IBM and provide advanced X-ray beamline capabilities to the U.S. semiconductor industry.

Notice text

Awarded on a sole source basis in accordance with attached redacted justification for other than full and open competition. 

Awarded contract 1333ND24PNB030428 to DECTRIS USA INC for 798300.00 on 2024-09-03.

Attachments

Files attached to this notice, newest first
File Type Posted
NB305000-24-01014 JOFOC (002) (002)_Redacted.pdf PDF

Notice history

Notices posted for this opportunity, newest first
Notice Type Posted
CHIPS XAFS and Diffraction, Silicon Drift Detector This notice · Latest Award Notice
Notice of Intent to Noncompetitively CHIPS XAFS and Diffraction, Silicon Drift Detector Award Notice
Notice of Intent to Noncompetitively CHIPS XAFS and Diffraction, Silicon Drift Detector Latest special notice Special Notice
CHIPS XAFS and Diffraction, Silicon Drift Detector Original Pre-Solicitation

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