Notice of Intent to Noncompetitively CHIPS XAFS and Diffraction, Silicon Drift Detector
Award Notice Posted
- Solicitation number
- 1333ND24PNB030428
- Agency
-
National Institute of Standards and Technology
Department of Commerce
- Awarded
- to Dectris USA Inc.
- Set-aside
- No set-aside
Opportunity facts
- Contract number
- 1333ND24PNB030428 Federal contract award
- NAICS code
- 334413 Semiconductor and Related Device Manufacturing
- PSC
- 6640 Laboratory Equipment And Supplies
- Place of performance
- Upton, New York 11973, United States
Notice details come from SAM.gov. Updated .
About this opportunity
The National Institute of Standards and Technology (NIST), an agency under the Department of Commerce, awarded a sole source contract (1333ND24PNB030428) to DECTRIS USA INC on September 30, 2024, valued at $798,300 for the procurement of two commercial X-ray detectors for the Beamline for Materials Measurement facility at Brookhaven National Laboratory. The acquisition includes a strip detector for high-resolution X-ray diffraction and a large-area, photo-counting X-ray detector designed to support semiconductor research under the CHIPS Research and Development Program in coordination with IBM researchers. Both detectors must meet stringent technical specifications including photon-counting pixel detector capabilities with six decades of dynamic range and count rates exceeding 10⁵ photons per second per pixel for the strip detector and 10⁶ photons per second per pixel for the large-area detector. NIST's extensive market research conducted from August 2023 through May 2024, which included a sources sought notice and requests for information, determined that Dectris AG was the sole commercial source capable of meeting all required technical specifications.
Notice text
Awarded on a sole source basis in accordance with the attached Justirifaction for Other Than Full an Open Competition.
Awarded contract 1333ND24PNB030428 to DECTRIS USA INC for 798300.00 on 2024-09-30.
Files
| File | Type | Posted |
|---|---|---|
| NB305000-24-01014 JOFOC (002) (002)_Redacted.pdf |
Notice history
| Notice | Type | Posted |
|---|---|---|
| CHIPS XAFS and Diffraction, Silicon Drift Detector | Award Notice | |
| This notice | Award Notice | |
| Notice of Intent to Noncompetitively CHIPS XAFS and Diffraction, Silicon Drift Detector | Special Notice | |
| CHIPS XAFS and Diffraction, Silicon Drift Detector | Pre-Solicitation |
Similar open opportunities
| Opportunity | Agency | Set-aside | Responses due |
|---|---|---|---|
| X-ray imaging detector system | Office of Science | No set-aside |
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