Annual Service Support for FEI INSPECT 50 Scanning Electron Microscope

Closed Solicitation Posted

Solicitation number
N6227120Q5018
Agency
Naval Supply Systems Command Department of the Navy, Department of Defense
Responses due
Set-aside
No set-aside

Opportunity facts

NAICS code
811219 Other Electronic and Precision Equipment Repair and Maintenance
PSC
J066 Maint/Repair/Rebuild Of Equipment- Instruments And Laboratory Equipment
Place of performance
Monterey, California 93940, United States

Notice details come from SAM.gov. Updated .

Notice text

This is a COMBINED SYNOPSIS/SOLICITATION for commercially available Annual Service Support for FEI Company INPECT 50 Scanning Electron Microscope (SEM) and is prepared in accordance with the information in FAR Subpart 12.6, using Simplified Acquisition Procedures for commercial items found at FAR 13, as supplemented with the additional information included in this notice. This announcement constitutes the only solicitation. 

This requirement is a Sole Source requirement specific to FEI Company INSPECT 50 Scanning Electron Microscope (SEM) Annual Service Support in accordance with the Performance Based Statement of Work.  See Request for Quote and Sole Source Justification attached. 

Attachments

Files attached to this notice, newest first
File Type Posted
RFQ N6227120Q5018.docx DOCX document
SSJ for SEM Maint_Redacted.pdf PDF

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