Annual Maintenance of FEI Helios 600i Focused Ion Beam / Scanning Electron Microscope for Benet Laboratories, Watervliet, NY
Closed Solicitation Posted
- Solicitation number
- W911PT25Q0053
- Agency
-
ACC Warren
Army Contracting Command, Department of Defense
- Responses due
- Set-aside
- No set-aside
Opportunity facts
- NAICS code
- 811210 Electronic and Precision Equipment Repair and Maintenance
- Place of performance
- Watervliet, New York 12189, United States
- Points of contact
Notice details come from SAM.gov. Updated .
About this opportunity
The Department of the Army Materiel Command Contracting Command Detroit Arsenal (ACC Warren) is seeking annual maintenance services for a FEI Helios 600i Focused Ion Beam/Scanning Electron Microscope located at Benet Laboratories in Watervliet, NY. This is a sole-source procurement specifically targeting FEI Company for a one-year maintenance contract covering the period from April 1, 2025 to March 31, 2026. The solicitation requires comprehensive maintenance including one preventive maintenance visit per year, calibration to factory specifications, replacement of original equipment manufacturer parts, and software updates for specific microscope components. The technical specifications call for the contractor to respond to service calls within 48 hours and provide telephone support during business hours. The solicitation (number W911PT25Q0053) is open for proposal submissions, with a response deadline of March 31, 2025.
The contract is not set aside for any specific business classification and falls under the NAICS category 811210 for Electronic and Precision Equipment Repair and Maintenance. The total estimated contract value is $34,000,000, covering maintenance for equipment including the Helios Nanolab 600i, FEI Easylift, Pt Deposition, ICE Detector, STEM Detector, and NavCam. The contractor will be required to provide certain consumable items like an Ion Source and related components. Performance will be conducted at Benet Laboratories, located in Watervliet, NY, with the technical point of contact being Ray Seitz. The procurement is classified under Product Service Code J036 for Maintenance/Repair/Rebuild of Special Industry Machinery, indicating the specialized nature of the required services.
Notice text
Solicitation of services to provide: annual maintenance for FEI Helios 600i Focused Ion Beam (FEB) / Scanning Electron Microscope at Benet Laboratories, Watervliet, NY per Performance Work Statement for one year.
Service Contract Labor Standards do not apply.
This is a Sole Source Procurement with FEI Company. All Responsible Proposals will be Considered.
Files
| File | Type | Posted |
|---|---|---|
| W911PT25Q0053 - Solicitation.pdf |
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