Advanced X-ray Analysis for Additive Manufacturing
Closed Solicitation Posted
- Solicitation number
- PR374991
- Agency
-
Department of Energy
- Responses due
- Set-aside
- No set-aside
Opportunity facts
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- PSC
- 6640 Laboratory Equipment And Supplies
- Place of performance
- Oak Ridge, Tennessee 37830, United States
- Points of contact
Notice details come from SAM.gov. Updated .
About this opportunity
The Department of Energy, through Oak Ridge National Laboratory (ORNL), is seeking advanced X-ray analysis systems for additive manufacturing research. The solicitation requires the procurement of two specialized X-ray systems: an X-ray Diffraction System and an X-ray Fluorescence System, with specific technical requirements including a modular design, 4 kW solid-state generator, 45-position sample changer, and temperature measurement capabilities up to 1500C. The contract will be awarded using a Lowest Price Technically Acceptable (LPTA) method, targeting vendors in the Analytical Laboratory Instrument Manufacturing sector (NAICS 334516). Proposal responses are due by May 16, 2025 at 3:00 PM EST, with vendor questions accepted until May 13, 2025 at 12:00 PM EST. The primary objective is to enhance ORNL's capabilities in analyzing material structures and manufacturing processes, with a focus on understanding batch-to-batch variability in additive manufacturing.
The solicitation is not designated as a small business set-aside and will be executed as a 30-week fixed-price subcontract managed by UT-Battelle, LLC. The place of performance is Oak Ridge, Tennessee, with a requirement that all deliverables must be completed by a United States citizen. While the exact contract value is marked as "TBD" in the draft subcontract, the procurement involves acquiring complex analytical laboratory instruments with specific technical capabilities. Payment terms are net 30 days, processed through the Ariba Network and made in U.S. dollars via electronic funds transfer. The technical point of contact is Christopher Ledford, and the procurement officer is Mckenzi Baz, both from Oak Ridge National Laboratory. The systems must have a footprint under 1.5 x 1.5 meters, use non-proprietary data formats, and provide cross-instrument correlative sample analysis capabilities.
Notice text
Advanced X-ray Analysis for Additive Manufacturing
Conduct a correlative analysis of the manufacturing process alongside chemical and structural characterization data to establish the relationship between process, structure, and properties of novel materials, particularly for additive manufacturing (AM). This analysis aims to enhance understanding of batch-to-batch variability and its effects on the structure of fabricated components, crucial for predicting component performance and service lifetime.
The Oak Ridge National Laboratory (ORNL) seeks to enhance capabilities in analytical X-ray analysis of additive manufacturing through the acquisition of the following systems:
X-ray Diffraction System:
Modular design for easy configuration changes.
Minimum 4 kW solid-state generator.
45-position sample changer.
Supports ambient and non-ambient stages.
Motorized stage accommodating large samples (max height: 100 mm).
Capable of temperature measurements up to 1500°C.
Uses Cu-anode X-ray source.
Beam current ranges: 1 pA to 300 nA at 30 kV and 1 pA to 100 nA at 5 kV.
Detector with large active area (> 100 mm²), energy resolution (<5 %), low dark background (< 1 cps), and high detection efficiency.
Cross-instrument correlative sampling through existing software or API access.
Automated data analysis software with autogenerated reporting.
Non-proprietary data format.
Footprint must be less than 1.5 x 1.5 meters.
X-ray Fluorescence (XRF) System:
Combination of wavelength-dispersive and energy-dispersive XRF capable of parallel operation.
Sample changes without venting the optical chamber.
Integrated X-Y-X sample changer for unattended operation.
Minimum 2.4 kW x-ray tube with multiple crystal types for elemental analysis.
High-precision goniometer for accurate positioning.
Scintillation detector for enhanced sensitivity on elements greater than Mn.
Capability to analyze loose powders.
Standardless analysis software for unknown alloys.
Complete system requiring only external utilities.
Requires 230V power and includes a chiller unit, various beam filters, collimators, sample masks (6mm to 37mm), standards, and training.
Mobile with wheels, and supports cross-instrument sampling.
Non-proprietary data format.
Footprint must be less than 1.5 x 1.5 meters.
Other Requirements:
Vendor must provide on-site installation and training for both systems.
Installation to be completed within 30 weeks of the issuance of the purchase order.
Files
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