SATPC0036050 Tab 04 4 Spec sheet.pdf
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- Attached to
- Optical Extensometer Federal contract opportunity
- Solicitation number
- 80NSSC24878588Q
About this file
This document is a specification sheet for an Optical Extensometer required for the Shape Memory Alloy (SMA) Low Temperature Characterization Rig as part of a NASA contract opportunity.
The specification covers the measurement instrument, adjustable mounting system, illumination system, electrical, data cables, and software required to operate the instrument. Key requirements include: field of view, working distance, resolution/accuracy, out-of-plane sensitivity, sample marking and tracking, illumination system, alignment system, measurement output, control interface, operating environment, size, mass, and safety considerations. The optical extensometer will be used to conduct tensile and fatigue testing of SMA materials in a high vacuum and low temperature environment. The vendor is required to provide operating instructions, software, drawings, and calibration documentation.
The related federal contract opportunity is a solicitation (Solicitation Number: 80NSSC24878588Q) issued by the National Aeronautics and Space Administration Shared Services Center for the procurement of this Optical Extensometer.
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Other files for this federal contract opportunity
| File | Type | Posted |
|---|---|---|
| SATPC0036050 Questions and Answers.pdf | ||
| SATPC0036050 Tab 10 Open Market RFQ.pdf |
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Text version
SMA Optical Extensometer Specification 1
Shape Memory Alloy Low Temperature Characterization Rig Optical Extensometer Specifications
June 20, 2024
Rev. 2
Background
The Shape Memory Alloy (SMA) Project will investigate the feasibility of utilizing SMA materials for various spaceflight applications. As part of the work, material characterization in representative environmental conditions will be needed. The SMA Low Temperature Characterization Rig will allow tensile and fatigue testing of candidate material in high vacuum and low temperature environments.
Conventional strain measurement devices cannot be utilized due to their need for direct sample contact, that would subject them to temperatures (40 deg K) well outside their rated operating temperatures. As a result, non-contact, optical strain measurement via test chamber viewport is required for this rig. The SMA chamber include a cold box within the vacuum chamber as well.
Optical access will be provided by 2 fused silica windows with thicknesses of approx. 0.5” and 0.25” and with vertical extent of > 5.0” and width > 3.0”.
Scope
The scope of this procurement covers this procurement covers the measurement instrument, adjustable mounting system, illumination system, electrical, data cables, and software required to operate the instrument. The system will be mounted to SMA Vacuum Chamber, and it will be NASA’s responsibility to design and build any adapters needed between instrument/illumination mount and the chamber.
Purchase Specifications
1) Field of View: >125mm vertically (100mm sample with approx. 20% elongation) < 2mm horizontal at designed working distance
2) Working Distance: > 200mm and < 300mm from front most surface of the instrument to the test sample plane.
3) Resolution/Accuracy: < 10um RMS dynamic (with sampling frequency > 100Hz) < 20uε strain ( with sampling frequency >100Hz)
4) Out of Plane Sensitivity: < 100uε/mm or Per ASTM E83 Class B-1, up to 1000um out of plane motion, while meeting Resolution/Accuracy requirement.
(Optical system optimized to reduce out of plane errors)
SMA Optical Extensometer Specification 2
5) Sample Marking and Tracking: Compatible with either white or black sample marking conventions.
Manual or Automatic marker detection, with ability to selectively limit FOV for marker detection.
6) Marker Tracking Speed: 0 to 1500mm/sec. or greater
7) Illumination System: Front Illumination with adjustable intensity (Range = Max to
20% of Max) . FOV coverage and maximum power adequate to meet resolution/accuracy requirements.
8) Alignment System: System provides alignment projection markers onto sample to allow precise alignment of sample to sensor vertical axis.
9) Alignment Adjustment: Instrument mounting system provide adjustment in Yaw, Pitch, and Roll, axis to align sample with sensor vertical axis.
10) Measurement Output: Continuous Analog or Digital Stream Analog: +/- 10 Vdc, BNC connector.
Digital: Serial UART, RS-232 or RS485, 16-bit resolution.
11) Control Interface: Stand-alone control interface to configure, initial, align, and run the instrument, without the need for PC interface.
12) Operating Environment: 10-40 deg. C 20-80% relative humidity, non-condensing.
12) Power Consumption: 100 Watts Maximum.
13) Power Input: 110 VAC, Single Phase.
14) Size (Instrument & Illumin): Less than 15000 Cubic Centimeters. Less than 400mm in length for the dimension that is perpendicular to viewport, when mounted to the chamber. (Does not include stand-alone control interface or any ancillary components that may be part of the system)
15) Mass (Instrument & Illumin): < 5.0 kg (does not include stand-alone control interface or any ancillary components that may be part of the system)
16) Safety In the event that the instrument utilizes lasers for either illumination of the sample or aligning the instrument, the lasers shall conform to CLASS 1, 2, or 3R per ANSI Z136.1 (2022)
17) Documentation Deliverables:
The vendor shall supply the following documentation at time of equipment delivery:
SMA Optical Extensometer Specification 3
Operating Instruction Manual for the System.
Any software needed to operate the Instrument.
Outline drawings of the Instrument and Mounting system.
Any Calibration documentation that is part of the vendors in-house acceptance testing.
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