Salient Characteristcs_JOEL.pdf

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JEOL SEM
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W91249-0012394550
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This document is a salient characteristics list that specifies equipment and components required for a scanning electron microscopy (SEM) system. The procurement includes one JSM-IT710HRLA SEM unit as the primary analytical instrument, designated as MP-69070LAB. Supporting equipment includes a Chamber Scope (MP-94322CS), a JEOL EDS 60mm energy dispersive spectroscopy detector for elemental analysis, and a Stage Navigation System for Large Area specimen examination (MP-94430SNSLS). The system is equipped with a Low Vacuum Hybrid Secondary Electron Detector (MP-94440LHSE) to enable imaging under low vacuum conditions.

The specification also includes multiple specimen handling accessories to support various sample types and sizes: a 76mm specimen holder (JU2014636), a 76mm insert for ten 12.5mm stubs (JU2006435), a 1.5-inch maximum vise holder (JU2014634), a 26-position Cambridge stub holder (JU2014635), and a 3.0-inch maximum vise holder (JU2014633). These accessories enable flexibility in specimen mounting and analysis of diverse materials and geometries.

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SALIENT CHARACTERISTICS

Qty Description

1 MP-69070LAB: JSM-IT710HRLA

1 MP-94322CS: Chamber Scope

1 JEOL EDS 60mm: JEOL EDS 60mm

1 MP-94430SNSLS: Stage Navigation System, Large Area

1 MP-94440LHSE: Low Vacuum Hybrid Secondary Electron Detector

1 JU2014636: 76mm Specimen Holder

1 JU2006435: Insert, 76mm for Ten 12.5mm Stubs

1 JU2014634: 1.5-inch Maximum Vise Holder

1 JU2014635: 26 Cambridge stub holder

1 JU2014633: 3.0-inch Maximum Vise Holder

File details come from the government source that posted it. Updated .