QA responses- AMND 1.pdf
PDF 67 KB Posted
- Solicitation number
- NIST-AMD-TC-RQ-26-01158
About this file
This is a Question & Answer Amendment document for Solicitation No. NIST-AMD-TC-RQ-26-01158, addressing clarifications on the procurement of a high-field electromagnet system for MRAM device metrology. The solicitation seeks a high-field electromagnet system including a bipolar power supply system designed for integration into an existing commercial wafer probe station that NIST already possesses and will integrate in-house. The electromagnet must apply magnetic fields perpendicular to the wafer and be capable of sweeping fields from negative to positive values. The magnet must fit within physical dimensional constraints of 11.5 cm length × 11.5 cm width × 19 cm height to properly integrate into the existing probe system.
The Q&A clarifies that NIST does not require a probe system to be supplied as part of this RFQ and contains no make and model restrictions or brand-name only requirements for the prober. The maximum wafer size to be probed is constrained only by the dimensional requirements specified in the Statement of Work. This is a template or clarification document that does not establish response dates, award dates, pricing terms, set-asides, or other contractual terms, serving solely to provide technical and procurement clarifications to potential vendors.
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Other files
| File | Type | Posted |
|---|---|---|
| RFQ attachment - FAR provisions.pdf | ||
| Statement of Work.pdf | ||
| SF1449.pdf |
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Text version
Question & Answer (Q&A) Amendment No. 0001 High-Field Electromagnet System for MRAM Metrology
Solicitation No. NIST-AMD-TC-RQ-26-01158
1. The SOW states that “the purpose of this acquisition is to procure a high-field electromagnet system, including a bipolar power supply system, to facilitate MRAM device metrology. This type of measurement requires magnetic fields to be applied in a wafer prober, in a direction perpendicular to the wafer, to be swept from negative to positive values.”
a. Question: Can NIST say if they are planning to integrate the magnet into an existing probe system they already have?
Answer: Yes, we are planning to integrate the magnet into an existing probe system.
The dimensional constraints for properly integrating the magnet into the system are given in the SOW.
2. The description of Line Item 0001 in the SOW states: High-field electromagnet system for integration into a commercial wafer probe station.
a. Question: Does NIST already have the probe system and plans to perform the integration in-house?
Answer: Yes, NIST has a commercial wafer prober system and plans to do the integration in-house.
3. Question: There is nothing in the SOW that indicates a probe system is to be supplied. Does NIST also require a probe system to be included in the RFQ? If so, can NIST provide the prober specifications?
Answer: No, NIST does not require a probe system to be included in the RFQ.
4. Question: What is the maximum wafer size to be probed?
Answer: The SOW specifies the measured constraint for which the volume of the magnet must fit into: “d. Physical Dimensions: The magnet must fit within a volume (Length x Width x Height) of 11.5 cm x 11.5 cm x 19 cm.”
5. Question: What is the make and model # of the prober?
Answer: The RFQ contains no make and model restrictions or other brand-name only requirements.
File details come from the government source that posted it. Updated .