Minimum Specifications.pdf

Agilent Cary 7000 Salient Characteristics:

Maximum Scanning Speed: UV-Vis 2,000 nm/min, NIR 8,000 nm/min Photometric Range (Abs):10 Abs Photometric System: Double beam Spectral Bandwidth: UV-Vis 0.01 – 5.00 nm, NIR 0.04 – 20 nm Wavelength: 175 – 3300 nm Auto polarizer wavelength range: 250–2500 nm Minimum solid sample size: 5.0 x 5.0 mm (0.2 x 0.2 in) Maximum solid sample size: 275 x 191 mm (10.8” x 7.5”); 30 mm thick (1.2”) Angular Limit: No angular limit (limit is given by the sample dimensions) Instrument Capabilities:

(1) Measure absolute reflection and transmission in a single sequence—at variable angle and s or p polarization—without moving or disturbing the sample.

(2) Measure diffusely scattered transmission and reflection at angle, with the freedom to control detector and sample position independently.

(3) Utilize the huge sample chamber to accommodate all sample types—from small to large—delivering 360 degrees of rotational flexibility.

a. High resolution optical encoder controls detector position and sample rotation down to 0.02°

(4) Control of beam collimation and patch size to match sample's true end-use conditions.

Adjustable apertures provide precise control of beam a) cone angle for improved accuracy or b) patch size from 2–5 mm (0.08–0.2 in) for varying sample sizes.

(5) Optical control of incoming and detected beam geometry. Incident beam angle (adjustable 3°–1° cone angle in 1° steps) and detected cone angle (adjustable 6° to 1° in 1° steps).

(6) Single baseline collect applies to all transmittance (T) and reflectance (R) measurements, at all angles, for a given polarization.

(7) Lock-down mechanism enables simple installation and removal of the UMA — with no re-alignment.

(8) Unattended automation.

Agilent Solids Autosampler Salient Characteristics:

Sample Holders:

(1) Multi-Sample Holder: Mount up to 32 x 1 in diameter samples up to 10 mm thick with maximum angle of incidence 45° or mount up to 24 x 1 in diameter samples up to 10 mm thick with maximum angle of incidence 65°.

(2) Wafer Holder: Mount single 8 in diameter samples up to 3 mm thick. Maximum angle of incidence 65°.

(3) All holders listed above can profile large samples (up to 8 in) for coating uniformity at spatial resolution down to 2 mm x 2 mm.

Measurement Modes:

(1) Absolute specular reflection at variable angle from 5–65° in 0.02° intervals

(2) Direct transmission and variable angle transmission from 0–65° in 0.02° intervals

(3) Diffuse scattering, reflection or transmission through independent sample rotation (360°) and detector positioning between 10–350° at 0.02° in intervals

a. Includes glossy scattering, scattered transmission and partial scattered transmission

(4) Absorptance, A where A= 1–R–T at variable angle without moving the sample or beam onto the sample for improved productivity and greater accuracy

(5) Reflection/Transmission at single wavelength (read) or wavelength range (scan)