JEOL Maintenance Service Salient Characteristics.docx

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JMS. JEOL (DART) Maintenance Service
Solicitation number
W91249-0012379597
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This is a Salient Characteristics document for a sole-source maintenance service contract. The government intends to award a non-competitive contract to JEOL USA Inc., located in Peabody, Massachusetts, for maintenance services on specialized laboratory instrumentation. The contract pertains to multiple JEOL scanning electron microscopes and analytical instruments, specifically including a JMS-T100LP ACCUTOF LC-PLUS mass spectrometer, a JSM-IT300LV scanning electron microscope with various detectors and navigation systems, and a JSM-IT500LV scanning electron microscope with comparable accessories and components. Each instrument is identified with specific model numbers, serial numbers, and component part numbers for precision maintenance tracking.

The Mission and Installation Contracting Command at Fort Gordon, Georgia is procuring this requirement under Simplified Acquisition Procedures for Commercial Products and Services (41 U.S.C. 1901, FAR 12.201-1). The solicitation is a Notice of Intent to Sole Source, not a competitive request for proposals. Interested vendors must submit clear and convincing evidence in writing demonstrating that competition would be advantageous to the government. The response deadline is 22 May 2026 at 10:00 AM EST. If no affirmative written responses are received by this deadline, the award will proceed without further notice. The NAICS code is 334516, and JEOL USA Inc.'s Cage Code is 51043.

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PWS JEOL Maintenance USACIL FY26.docx DOCX document

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Description

Model #
Quantity
JMS-T100LP ACCUTOF LC-PLUS 351920 823022218 SN: MS106600060
351920
1

ION SOURCE, DART SVP, ACCUTOF

W/JG10032&JG10049

JU2011313
1
JSM-IT300LV SCANNING ELECTRON MICROSCOPE 377791 SN: MP137200025
377791
1
MP-91110SNS STAGE NAVIGATION SYSTEM
803083092
1
MP-94240BEIW BACKSCATTER ELECT. DETECTOR
803083114
1
MP-94250LSED LOW VAC SECOND ELECT DTECTR
803083122
1
IRCS PCIE PIP CC-A0120-006-PCIE 905-00067
JU2014641
1
JSM-IT500LV SCANNING ELECTRON MICROSCOPE SN MP1373000620062
383236
1
MP-94350LSED LOW VAC SED SN: MP3238000670067
813007500
1
MP-94340BEIW BACKSCATTERED DETECTOR SN: MP5476002870287
813007615
1
MP-94330SNS STAGE NAVIGATION SYST SN: MP3558002790279
813007496
1
IRCS PCIE PIP CC-A0120-006-PCIE 905-00067
JU2014641
1

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