JEOL Maintenance Service Salient Characteristics.docx
DOCX document 15 KB Posted
- Attached to
- JMS. JEOL (DART) Maintenance Service
- Solicitation number
- W91249-0012379597
About this file
This is a Salient Characteristics document for a sole-source maintenance service contract. The government intends to award a non-competitive contract to JEOL USA Inc., located in Peabody, Massachusetts, for maintenance services on specialized laboratory instrumentation. The contract pertains to multiple JEOL scanning electron microscopes and analytical instruments, specifically including a JMS-T100LP ACCUTOF LC-PLUS mass spectrometer, a JSM-IT300LV scanning electron microscope with various detectors and navigation systems, and a JSM-IT500LV scanning electron microscope with comparable accessories and components. Each instrument is identified with specific model numbers, serial numbers, and component part numbers for precision maintenance tracking.
The Mission and Installation Contracting Command at Fort Gordon, Georgia is procuring this requirement under Simplified Acquisition Procedures for Commercial Products and Services (41 U.S.C. 1901, FAR 12.201-1). The solicitation is a Notice of Intent to Sole Source, not a competitive request for proposals. Interested vendors must submit clear and convincing evidence in writing demonstrating that competition would be advantageous to the government. The response deadline is 22 May 2026 at 10:00 AM EST. If no affirmative written responses are received by this deadline, the award will proceed without further notice. The NAICS code is 334516, and JEOL USA Inc.'s Cage Code is 51043.
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Other files
| File | Type | Posted |
|---|---|---|
| PWS JEOL Maintenance USACIL FY26.docx | DOCX document |
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Text version
Description
| Model # |
| Quantity |
| JMS-T100LP ACCUTOF LC-PLUS 351920 823022218 SN: MS106600060 |
| 351920 |
| 1 |
ION SOURCE, DART SVP, ACCUTOF
W/JG10032&JG10049
| JU2011313 |
| 1 |
| JSM-IT300LV SCANNING ELECTRON MICROSCOPE 377791 SN: MP137200025 |
| 377791 |
| 1 |
| MP-91110SNS STAGE NAVIGATION SYSTEM |
| 803083092 |
| 1 |
| MP-94240BEIW BACKSCATTER ELECT. DETECTOR |
| 803083114 |
| 1 |
| MP-94250LSED LOW VAC SECOND ELECT DTECTR |
| 803083122 |
| 1 |
| IRCS PCIE PIP CC-A0120-006-PCIE 905-00067 |
| JU2014641 |
| 1 |
| JSM-IT500LV SCANNING ELECTRON MICROSCOPE SN MP1373000620062 |
| 383236 |
| 1 |
| MP-94350LSED LOW VAC SED SN: MP3238000670067 |
| 813007500 |
| 1 |
| MP-94340BEIW BACKSCATTERED DETECTOR SN: MP5476002870287 |
| 813007615 |
| 1 |
| MP-94330SNS STAGE NAVIGATION SYST SN: MP3558002790279 |
| 813007496 |
| 1 |
| IRCS PCIE PIP CC-A0120-006-PCIE 905-00067 |
| JU2014641 |
| 1 |
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